2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
Latest Publications

TOTAL DOCUMENTS

108

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

9781467350570

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Comparison of proton damage effects in standard and enhanced depletion CMOS Image Sensors

2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ◽

10.1109/radecs.2013.6937445 ◽

2013 ◽

Cited By ~ 1

Author(s):

Andrew Pike ◽

Jerome Pratlong ◽

Tom Greig

Keyword(s):

Image Sensors ◽

Cmos Image Sensors

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Microdose induced drain leakage effects in power trench MOSFETs: Experiment and modeling

2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ◽

10.1109/radecs.2013.6937359 ◽

2013 ◽

Author(s):

Gennady I. Zebrev ◽

Alexander S. Vatuev ◽

Rustem G. Useinov ◽

Vladimir V. Emeliyanov ◽

Vasily S. Anashin ◽

...

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Modeling the response of the ESAPMOS4 RADFETs for the ALPHASAT CTTB experiment

2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ◽

10.1109/radecs.2013.6937367 ◽

2013 ◽

Author(s):

P. Goncalves ◽

A. Keating ◽

A. Trindade ◽

P. Rodrigues ◽

M. Ferreira ◽

...

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Neutron and gamma fields at neutron spallation sources for single-event-effects testing

2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ◽

10.1109/radecs.2013.6937365 ◽

2013 ◽

Cited By ~ 1

Author(s):

S. P. Platt ◽

Q. Hong ◽

S. J. Mein ◽

L. H. Zhang

Keyword(s):

Single Event ◽

Single Event Effects

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A study of the robustness against SEUs of digital circuits implemented with FPGA DSPs

2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ◽

10.1109/radecs.2013.6937459 ◽

2013 ◽

Author(s):

Felipe Serrano ◽

Juan Antonio Clemente ◽

Hortensia Mecha

Keyword(s):

Digital Circuits

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Long term destructive SEE risk and calculations using multiple “worst-case” events vs modelling

2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ◽

10.1109/radecs.2013.6937424 ◽

2013 ◽

Author(s):

Piers Jiggens ◽

Hugh Evans ◽

Pete Truscott ◽

Daniel Heynderickx ◽

Fan Lei ◽

...

Keyword(s):

Worst Case

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NAND flash memory in-flight data from PROBA-II spacecraft

2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ◽

10.1109/radecs.2013.6937432 ◽

2013 ◽

Cited By ~ 1

Author(s):

M. D'Alessio ◽

C. Poivey ◽

D. Walter ◽

K. Gruermann ◽

F. Gliem ◽

...

Keyword(s):

Flash Memory ◽

Nand Flash ◽

Nand Flash Memory ◽

Flight Data

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Follow-up multicenter alpha counting comparison

2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ◽

10.1109/radecs.2013.6937355 ◽

2013 ◽

Cited By ~ 1

Author(s):

J. D. Wilkinson ◽

B. M. Clark ◽

R. Wong ◽

C. Slayman ◽

M. S. Gordon ◽

...

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Comparing software-based fault detection techniques applied at different abstraction levels

2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ◽

10.1109/radecs.2013.6937383 ◽

2013 ◽

Author(s):

Eduardo Chielle ◽

Daniel Henrique Grehs ◽

Jose Rodrigo Azambuja ◽

Fernanda Lima Kastensmidt

Keyword(s):

Fault Detection ◽

Detection Techniques ◽

Abstraction Levels

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A low-power and area-efficient radiation-hard redundant flip-flop, DICE ACFF, in a 65 nm thin-BOX FD-SOI

2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ◽

10.1109/radecs.2013.6937380 ◽

2013 ◽

Cited By ~ 1

Author(s):

K. Kubota ◽

M. Masuda ◽

J. Furuta ◽

Y. Manzawa ◽

S. Kanda ◽

...

Keyword(s):

Low Power ◽

Flip Flop ◽

Radiation Hard ◽

Area Efficient

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2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Comparison of proton damage effects in standard and enhanced depletion CMOS Image Sensors

Microdose induced drain leakage effects in power trench MOSFETs: Experiment and modeling

Modeling the response of the ESAPMOS4 RADFETs for the ALPHASAT CTTB experiment

Neutron and gamma fields at neutron spallation sources for single-event-effects testing

A study of the robustness against SEUs of digital circuits implemented with FPGA DSPs

Long term destructive SEE risk and calculations using multiple “worst-case” events vs modelling

NAND flash memory in-flight data from PROBA-II spacecraft

Follow-up multicenter alpha counting comparison

Comparing software-based fault detection techniques applied at different abstraction levels

A low-power and area-efficient radiation-hard redundant flip-flop, DICE ACFF, in a 65 nm thin-BOX FD-SOI

2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
Latest Publications