2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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9781467350570
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Microdose induced drain leakage effects in power trench MOSFETs: Experiment and modeling

2013 ◽  
Author(s):  
Gennady I. Zebrev ◽  
Alexander S. Vatuev ◽  
Rustem G. Useinov ◽  
Vladimir V. Emeliyanov ◽  
Vasily S. Anashin ◽  
...  

Modeling the response of the ESAPMOS4 RADFETs for the ALPHASAT CTTB experiment

2013 ◽  
Author(s):  
P. Goncalves ◽  
A. Keating ◽  
A. Trindade ◽  
P. Rodrigues ◽  
M. Ferreira ◽  
...  

Long term destructive SEE risk and calculations using multiple “worst-case” events vs modelling

2013 ◽  
Author(s):  
Piers Jiggens ◽  
Hugh Evans ◽  
Pete Truscott ◽  
Daniel Heynderickx ◽  
Fan Lei ◽  
...  
Keyword(s):  
Worst Case

NAND flash memory in-flight data from PROBA-II spacecraft

2013 ◽  
Author(s):  
M. D'Alessio ◽  
C. Poivey ◽  
D. Walter ◽  
K. Gruermann ◽  
F. Gliem ◽  
...  
Keyword(s):  
Flash Memory ◽  
Nand Flash ◽  
Nand Flash Memory ◽  
Flight Data

Follow-up multicenter alpha counting comparison

2013 ◽  
Author(s):  
J. D. Wilkinson ◽  
B. M. Clark ◽  
R. Wong ◽  
C. Slayman ◽  
M. S. Gordon ◽  
...  
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