Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences
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Published By Springer Berlin Heidelberg

9783642087172, 9783662095188

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The Quest for Ultra-High Resolution

Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences ◽

10.1007/978-3-662-09518-8_2 ◽

2001 ◽

pp. 35-79 ◽

Author(s):

J. M. Cowley

Keyword(s):

High Resolution

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Weak-Beam Electron Microscopy

Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences ◽

10.1007/978-3-662-09518-8_8 ◽

2001 ◽

pp. 245-271

Author(s):

D. J. H. Cockayne

Keyword(s):

Electron Microscopy ◽

Beam Electron ◽

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Quantitative Analysis of High-Resolution Atomic Images

Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences ◽

10.1007/978-3-662-09518-8_5 ◽

2001 ◽

pp. 161-190

Author(s):

S. Q. Wang ◽

Y. M. Wang ◽

H. Q. Ye

Keyword(s):

Quantitative Analysis ◽

High Resolution

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Inelastic Scattering in Electron Microscopy-Effects, Spectrometry and Imaging

Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences ◽

10.1007/978-3-662-09518-8_4 ◽

2001 ◽

pp. 113-159 ◽

Author(s):

Z. L. Wang

Keyword(s):

Electron Microscopy ◽

Inelastic Scattering

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Electron Amorphography

Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences ◽

10.1007/978-3-662-09518-8_7 ◽

2001 ◽

pp. 223-243

Author(s):

Lu-Chang Qin

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Electron Crystallography-Structure Determination by Combining HREM, Crystallographic Image Processing and Electron Diffraction

Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences ◽

10.1007/978-3-662-09518-8_6 ◽

2001 ◽

pp. 191-222 ◽

Author(s):

Xiaodong Zou ◽

Thomas E. Weirich ◽

Sven Hovmöller

Keyword(s):

Image Processing ◽

Electron Diffraction ◽

Structure Determination ◽

Electron Crystallography

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Z-Contrast Imaging in the Scanning Transmission Electron Microscope

Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences ◽

10.1007/978-3-662-09518-8_3 ◽

2001 ◽

pp. 81-111 ◽

Author(s):

Stephen J. Pennycook ◽

Yanfa Yan

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

Contrast Imaging ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

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The Modern Microscope Today

Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences ◽

10.1007/978-3-662-09518-8_1 ◽

2001 ◽

pp. 1-34

Author(s):

Michael M. Kersker

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Point Group and Space Group Identification by Convergent Beam Electron Diffraction

Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences ◽

10.1007/978-3-662-09518-8_9 ◽

2001 ◽

pp. 273-299

Author(s):

Yi Liu

Keyword(s):

Electron Diffraction ◽

Group Identification ◽

Point Group ◽

Convergent Beam Electron Diffraction ◽

Beam Electron ◽

Space Group ◽

Convergent Beam

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Advanced Techniques in TEM Specimen Preparation

Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences ◽

10.1007/978-3-662-09518-8_10 ◽

2001 ◽

pp. 301-361 ◽

Author(s):

S. Roberts ◽

J. McCaffrey ◽

L. Giannuzzi ◽

F. Stevie ◽

N. Zaluzec

Keyword(s):

Specimen Preparation

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