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design for yield
Recently Published Documents
TOTAL DOCUMENTS
30
(FIVE YEARS 5)
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Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
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Optimisation of a catalytic hydrothermal liquefaction process using central composite design for yield improvement of bio-oil
Biomass Conversion and Biorefinery
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10.1007/s13399-021-01451-8
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2021
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Author(s):
Monika Kashimalla
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Sharanya Suraboyina
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Vidya Dubbaka
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Anand Polumati
Keyword(s):
Central Composite Design
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Hydrothermal Liquefaction
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Yield Improvement
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Bio Oil
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Liquefaction Process
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Central Composite
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Design For Yield
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Automating Design For Yield: Silicon Learning to Predictive Models and Design Optimization
2020 IEEE International Test Conference (ITC)
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10.1109/itc44778.2020.9325263
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2020
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Author(s):
Srikanth Venkat Raman
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Pongpachara Limpisathian
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Pascal Meinerzhagen
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Suriyaprakash Natarajan
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Eric Yang
Keyword(s):
Design Optimization
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Predictive Models
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Design For Yield
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Automated Design For Yield Through Defect Tolerance
2020 IEEE 38th VLSI Test Symposium (VTS)
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10.1109/vts48691.2020.9107558
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2020
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Author(s):
Suriyaprakash Natarajan
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Andres F. Malavasi
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Pascal A. Meinerzhagen
Keyword(s):
Automated Design
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Defect Tolerance
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Design For Yield
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A novel design-for-yield solution based on interconnect level layout improvements at 7nm technology node
Design-Process-Technology Co-optimization for Manufacturability XIII
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10.1117/12.2514896
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2019
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Author(s):
Jaehwan Kim
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Sangah Lee
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Byungchul Shin
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Junsu Jeon
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Jin Kim
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...
Keyword(s):
Technology Node
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Novel Design
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Design For Yield
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Cache Design for Yield-per-Area Maximization: Switchable Spare Columns with Disabling (SSC-Disable)
2019 IEEE 37th VLSI Test Symposium (VTS)
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10.1109/vts.2019.8758652
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2019
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Author(s):
Soowang Park
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Sandeep K. Gupta
Keyword(s):
Cache Design
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Design For Yield
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Pre-Tapeout Design for Yield Application: Design based Diffing, Pattern Analytics and Risk Scoring
2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM)
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10.1109/edtm.2018.8421477
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2018
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Cited By ~ 1
Author(s):
Rami Salem
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Vic Vadi
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Angelo Pinto
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Piyush Pathak
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Ya-Chieh Lai
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...
Keyword(s):
Risk Scoring
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Application Design
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Design For Yield
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Characterization of Low Drop-Out during ageing and design for yield
Microelectronics Reliability
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10.1016/j.microrel.2017.07.047
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2017
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Vol 76-77
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pp. 92-96
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Cited By ~ 3
Author(s):
R. Lajmi
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F. Cacho
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E. Lauga Larroze
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S. Bourdel
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P. Benech
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...
Keyword(s):
Drop Out
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Design For Yield
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T1B: Special session: Data analytics driven design for yield, manufacturability and reliability: Where machine learning meets design automation
2017 30th IEEE International System-on-Chip Conference (SOCC)
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10.1109/socc.2017.8226045
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2017
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Author(s):
Johanna Sepulveda
Keyword(s):
Machine Learning
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Design Automation
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Data Analytics
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Special Session
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Design For Yield
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Logic characterization vehicle design for yield learning
2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
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10.1109/asmc.2016.7491080
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2016
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Author(s):
Ben Niewenhuis
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Zeye Dexter Liu
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Soumya Mittal
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R. D. Shawn Blanton
Keyword(s):
Vehicle Design
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Yield Learning
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Design For Yield
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On Optimal Latin Hypercube Design for Yield Analysis of Analog Circuits
2015 Austrian Workshop on Microelectronics
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10.1109/austrochip.2015.14
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2015
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Cited By ~ 2
Author(s):
Hiwa Mahmoudi
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Horst Zimmermann
Keyword(s):
Analog Circuits
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Latin Hypercube Design
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Latin Hypercube
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Yield Analysis
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Optimal Latin Hypercube Design
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Design For Yield
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