2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
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79

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2

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Published By SPIE

9781510617537, 9781510617544

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Multi-axis parallelism measuring system with temperature insensitivity

2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems ◽

10.1117/12.2288058 ◽

2018 ◽

Author(s):

Kai Zhang ◽

Lei Zhang

Keyword(s):

Measuring System

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Smartphone based hemispherical photography for canopy structure measurement

2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems ◽

10.1117/12.2285911 ◽

2018 ◽

Author(s):

Yi Yang ◽

Xuefen Wan ◽

Jian Cui ◽

Tao Zheng ◽

Xueqin Jiang ◽

...

Keyword(s):

Canopy Structure ◽

Hemispherical Photography ◽

Structure Measurement

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Welding studs detection based on line structured light

2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems ◽

10.1117/12.2288649 ◽

2018 ◽

Author(s):

Lei Geng ◽

Jia Wang ◽

Wen Wang ◽

Zhitao Xiao

Keyword(s):

Structured Light ◽

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Glue detection based on teaching points constraint and tracking model of pixel convolution

2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems ◽

10.1117/12.2288628 ◽

2018 ◽

Author(s):

Lei Geng ◽

Xiao Ma ◽

ZhiTao Xiao ◽

Wen Wang

Keyword(s):

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Displacement sensor based on intra-cavity tuning of dual-frequency gas laser

2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems ◽

10.1117/12.2291990 ◽

2018 ◽

Author(s):

Yanxiong Niu ◽

Ning Liu ◽

Jiyang Li ◽

Haisha Niu

Keyword(s):

Displacement Sensor ◽

Dual Frequency ◽

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Femtosecond Z-scan measurements of the nonlinear refractive index of fused silica

2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems ◽

10.1117/12.2295559 ◽

2018 ◽

Author(s):

Yurong Ma ◽

Lin Zhang ◽

Zhendong Shi ◽

Huan Ren ◽

Yi Yang ◽

...

Keyword(s):

Refractive Index ◽

Nonlinear Refractive Index ◽

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Automatic measuring method of catenary geometric parameters based on laser scanning and imaging

2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems ◽

10.1117/12.2295340 ◽

2018 ◽

Author(s):

Songhong Chang ◽

Luhua Fu ◽

Changjie Liu

Keyword(s):

Laser Scanning ◽

Measuring Method ◽

Geometric Parameters ◽

Automatic Measuring ◽

Automatic Measuring Method

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A novel multi-dimensional absolute distance measurement system using a basic frequency modulated continuous wave radar and an external cavity laser with trilateration metrology

2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems ◽

10.1117/12.2295183 ◽

2018 ◽

Author(s):

xingting xiong ◽

Xinghua Qu ◽

Fumin Zhang

Keyword(s):

Measurement System ◽

Continuous Wave ◽

External Cavity ◽

Distance Measurement ◽

Absolute Distance ◽

External Cavity Laser ◽

Basic Frequency ◽

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Study on the calibration and optimization of double theodolites baseline

2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems ◽

10.1117/12.2295155 ◽

2018 ◽

Author(s):

Jingyi Ma ◽

Jinpin Ni ◽

Zhichao Wu

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Compensation of sampling error in frequency scanning interferometry

2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems ◽

10.1117/12.2295243 ◽

2018 ◽

Author(s):

Yue Shang ◽

Jiarui Lin ◽

Linghui Yang ◽

Yongjie Ren

Keyword(s):

Sampling Error ◽

Frequency Scanning ◽

Frequency Scanning Interferometry

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