2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)
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9781467306973, 9781467306966, 9781467306959
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Adaptive testing: Conquering process variations

2012 ◽  
Author(s):  
Ender Yilmaz ◽  
Sule Ozev ◽  
Ozgur Sinanoglu ◽  
Peter Maxwell
Keyword(s):  
Process Variations ◽  
Adaptive Testing

VLSI Test technology: Why is the field not sexy enough?

2012 ◽  
Author(s):  
Said Hamdioui ◽  
Rob Aitken
Keyword(s):  
Vlsi Test ◽  
Test Technology

Dependable embedded systems: The German research foundation DFG priority program SPP 1500

2012 ◽  
Author(s):  
Jorg Henkel ◽  
Oliver Bringmann ◽  
Andreas Herkersdorf ◽  
Wolfgang Rosenstiel ◽  
Norbert Wehn
Keyword(s):  
Embedded Systems ◽  
German Research Foundation ◽  
German Research ◽  
Priority Program ◽  
Dependable Embedded Systems

scholarly journals Time-division multiplexing for testing SoCs with DVS and multiple voltage islands

2012 ◽  
Author(s):  
Xrysovalantis Kavousianos ◽  
Krishnendu Chakrabarty ◽  
Arvind Jain ◽  
Rubin Parekhji
Keyword(s):  
Time Division Multiplexing ◽  
Time Division ◽  
Voltage Islands

Combining dynamic slicing and mutation operators for ESL correction

2012 ◽  
Author(s):  
Urmas Repinski ◽  
Hanno Hantson ◽  
Maksim Jenihhin ◽  
Jaan Raik ◽  
Raimund Ubar ◽  
...  
Keyword(s):  
Dynamic Slicing ◽  
Mutation Operators

Indirect method for random jitter measurement on SoCs using critical path characterization

2012 ◽  
Author(s):  
Jae Wook Lee ◽  
Ji Hwan Chun ◽  
J. A. Abraham
Keyword(s):  
Indirect Method ◽  
Critical Path ◽  
Jitter Measurement ◽  
Random Jitter

Power-aware testing: The next stage

2012 ◽  
Author(s):  
Xiaoqing Wen

Test tool qualification through fault injection

2012 ◽  
Author(s):  
Q. Wang ◽  
A. Wallin ◽  
V. Izosimov ◽  
U. Ingelsson ◽  
Z. Peng
Keyword(s):  
Fault Injection ◽  
Test Tool

On-chip temperature and voltage measurement for field testing

2012 ◽  
Author(s):  
Yukiya Miura ◽  
Yasuo Sato ◽  
Yousuke Miyake ◽  
Seiji Kajihara
Keyword(s):  
Field Testing ◽  
Voltage Measurement ◽  
Chip Temperature ◽  
On Chip
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