2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)
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TOTAL DOCUMENTS

66

(FIVE YEARS 0)

H-INDEX

9

(FIVE YEARS 0)

Published By IEEE

9781467306973, 9781467306966, 9781467306959

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Time-division multiplexing for testing SoCs with DVS and multiple voltage islands

2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) ◽

10.1109/ets.2012.6233019 ◽

2012 ◽

Author(s):

Xrysovalantis Kavousianos ◽

Krishnendu Chakrabarty ◽

Arvind Jain ◽

Rubin Parekhji

Keyword(s):

Time Division Multiplexing ◽

Time Division ◽

Voltage Islands

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VLSI Test technology: Why is the field not sexy enough?

2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) ◽

10.1109/ets.2012.6233047 ◽

2012 ◽

Author(s):

Said Hamdioui ◽

Rob Aitken

Keyword(s):

Vlsi Test ◽

Test Technology

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Dependable embedded systems: The German research foundation DFG priority program SPP 1500

2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) ◽

10.1109/ets.2012.6233053 ◽

2012 ◽

Author(s):

Jorg Henkel ◽

Oliver Bringmann ◽

Andreas Herkersdorf ◽

Wolfgang Rosenstiel ◽

Norbert Wehn

Keyword(s):

Embedded Systems ◽

German Research Foundation ◽

German Research ◽

Priority Program ◽

Dependable Embedded Systems

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Adaptive testing: Conquering process variations

2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) ◽

10.1109/ets.2012.6233045 ◽

2012 ◽

Author(s):

Ender Yilmaz ◽

Sule Ozev ◽

Ozgur Sinanoglu ◽

Peter Maxwell

Keyword(s):

Process Variations ◽

Adaptive Testing

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Test tool qualification through fault injection

2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) ◽

10.1109/ets.2012.6233042 ◽

2012 ◽

Author(s):

Q. Wang ◽

A. Wallin ◽

V. Izosimov ◽

U. Ingelsson ◽

Z. Peng

Keyword(s):

Fault Injection ◽

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On-chip temperature and voltage measurement for field testing

2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) ◽

10.1109/ets.2012.6233035 ◽

2012 ◽

Author(s):

Yukiya Miura ◽

Yasuo Sato ◽

Yousuke Miyake ◽

Seiji Kajihara

Keyword(s):

Field Testing ◽

Voltage Measurement ◽

Chip Temperature ◽

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Combining dynamic slicing and mutation operators for ESL correction

2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) ◽

10.1109/ets.2012.6233020 ◽

2012 ◽

Author(s):

Urmas Repinski ◽

Hanno Hantson ◽

Maksim Jenihhin ◽

Jaan Raik ◽

Raimund Ubar ◽

...

Keyword(s):

Dynamic Slicing ◽

Mutation Operators

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Indirect method for random jitter measurement on SoCs using critical path characterization

2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) ◽

10.1109/ets.2012.6233022 ◽

2012 ◽

Author(s):

Jae Wook Lee ◽

Ji Hwan Chun ◽

J. A. Abraham

Keyword(s):

Indirect Method ◽

Critical Path ◽

Jitter Measurement ◽

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Reducing test cost for mixed signal circuits “From TOETS to ELESIS”

2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) ◽

10.1109/ets.2012.6233051 ◽

2012 ◽

Author(s):

Mohamed Azimane

Keyword(s):

Test Cost ◽

Mixed Signal ◽

Mixed Signal Circuits

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Power-aware testing: The next stage

2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) ◽

10.1109/ets.2012.6233000 ◽

2012 ◽

Author(s):

Xiaoqing Wen

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