New Horizons of Applied Scanning Electron Microscopy - Springer Series in Surface Sciences
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Published By Springer Berlin Heidelberg

9783642031595, 9783642031601

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Application Example 37: Adhesion Between the Hard Chromium Coating and Copper Substrate

New Horizons of Applied Scanning Electron Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-642-03160-1_38 ◽

2009 ◽

pp. 157-159

Author(s):

Kenichi Shimizu ◽

Tomoaki Mitani

Keyword(s):

Copper Substrate ◽

Chromium Coating ◽

Hard Chromium

Application Example 23: Microstructure of a Ti Alloy

New Horizons of Applied Scanning Electron Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-642-03160-1_24 ◽

2009 ◽

pp. 97-98

Author(s):

Kenichi Shimizu ◽

Tomoaki Mitani

Keyword(s):

Ti Alloy

Application Example 25: Cracks in a Nitrogen-Doped Stainless Steel

New Horizons of Applied Scanning Electron Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-642-03160-1_26 ◽

2009 ◽

pp. 101-103

Author(s):

Kenichi Shimizu ◽

Tomoaki Mitani

Keyword(s):

Stainless Steel ◽

Nitrogen Doped

Application Example 39: On 3D Imaging of Semiconductor Devices by FE-SEM

New Horizons of Applied Scanning Electron Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-642-03160-1_40 ◽

2009 ◽

pp. 163-166

Author(s):

Kenichi Shimizu ◽

Tomoaki Mitani

Keyword(s):

3D Imaging ◽

Semiconductor Devices

Application Example 33: Cross-Sectional Examination of a Thermal-Sprayed WC-18% Co Coating on a Titanium Alloy

New Horizons of Applied Scanning Electron Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-642-03160-1_34 ◽

2009 ◽

pp. 135-139

Author(s):

Kenichi Shimizu ◽

Tomoaki Mitani

Keyword(s):

Titanium Alloy ◽

Cross Sectional

Application Example 28: Cross-Sectional Examination of a Flash Memory Device

New Horizons of Applied Scanning Electron Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-642-03160-1_29 ◽

2009 ◽

pp. 115-121

Author(s):

Kenichi Shimizu ◽

Tomoaki Mitani

Keyword(s):

Flash Memory ◽

Memory Device ◽

Cross Sectional

Application Example 24: Microstructure of a Ni-Based Super Alloy for Aerospace Applications

New Horizons of Applied Scanning Electron Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-642-03160-1_25 ◽

2009 ◽

pp. 99-100

Author(s):

Kenichi Shimizu ◽

Tomoaki Mitani

Keyword(s):

Aerospace Applications ◽

Super Alloy

Application Example 15: Cross-Sectional Examination of an Etched Al Foil for Capacitor Application

New Horizons of Applied Scanning Electron Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-642-03160-1_16 ◽

2009 ◽

pp. 45-48 ◽

Cited By ~ 5

Author(s):

Kenichi Shimizu ◽

Tomoaki Mitani

Keyword(s):

Cross Sectional

Application Example 34: Cross-Sectional Examination of a Thermal Barrier Coating on the Ni-based Super Alloy for Aerospace Applications

New Horizons of Applied Scanning Electron Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-642-03160-1_35 ◽

2009 ◽

pp. 141-143

Author(s):

Kenichi Shimizu ◽

Tomoaki Mitani

Keyword(s):

Thermal Barrier Coating ◽

Thermal Barrier ◽

Cross Sectional ◽

Aerospace Applications ◽

Barrier Coating ◽

Super Alloy

Application Example 26: Sample Surface Preparation Using rf-GD Sputtering for Cross-Sectional Examination

New Horizons of Applied Scanning Electron Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-642-03160-1_27 ◽

2009 ◽

pp. 105-107

Author(s):

Kenichi Shimizu ◽

Tomoaki Mitani

Keyword(s):

Surface Preparation ◽

Sample Surface ◽

Cross Sectional

New Horizons of Applied Scanning Electron Microscopy - Springer Series in Surface SciencesLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

Application Example 37: Adhesion Between the Hard Chromium Coating and Copper Substrate

Application Example 23: Microstructure of a Ti Alloy

Application Example 25: Cracks in a Nitrogen-Doped Stainless Steel

Application Example 39: On 3D Imaging of Semiconductor Devices by FE-SEM

Application Example 33: Cross-Sectional Examination of a Thermal-Sprayed WC-18% Co Coating on a Titanium Alloy

Application Example 28: Cross-Sectional Examination of a Flash Memory Device

Application Example 24: Microstructure of a Ni-Based Super Alloy for Aerospace Applications

Application Example 15: Cross-Sectional Examination of an Etched Al Foil for Capacitor Application

Application Example 34: Cross-Sectional Examination of a Thermal Barrier Coating on the Ni-based Super Alloy for Aerospace Applications

Application Example 26: Sample Surface Preparation Using rf-GD Sputtering for Cross-Sectional Examination

New Horizons of Applied Scanning Electron Microscopy - Springer Series in Surface Sciences
Latest Publications