Machine Learning in VLSI Computer-Aided Design
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21

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1

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Published By Springer International Publishing

9783030046651, 9783030046668

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Machine Learning Approaches for IC Manufacturing Yield Enhancement

Machine Learning in VLSI Computer-Aided Design ◽

10.1007/978-3-030-04666-8_6 ◽

2019 ◽

pp. 175-199

Author(s):

Hongge Chen ◽

Duane S. Boning

Keyword(s):

Machine Learning ◽

Yield Enhancement ◽

Learning Approaches ◽

Ic Manufacturing ◽

Manufacturing Yield

SynTunSys: A Synthesis Parameter Autotuning System for Optimizing High-Performance Processors

Machine Learning in VLSI Computer-Aided Design ◽

10.1007/978-3-030-04666-8_18 ◽

2019 ◽

pp. 539-570

Author(s):

Matthew M. Ziegler ◽

Hung-Yi Liu ◽

George Gristede ◽

Bruce Owens ◽

Ricardo Nigaglioni ◽

...

Keyword(s):

High Performance ◽

Synthesis Parameter

Multicore Power and Thermal Proxies Using Least-Angle Regression

Machine Learning in VLSI Computer-Aided Design ◽

10.1007/978-3-030-04666-8_19 ◽

2019 ◽

pp. 571-608

Author(s):

Rupesh Raj Karn ◽

Ibrahim M. Elfadel

Keyword(s):

Least Angle Regression

A Preliminary Taxonomy for Machine Learning in VLSI CAD

Machine Learning in VLSI Computer-Aided Design ◽

10.1007/978-3-030-04666-8_1 ◽

2019 ◽

pp. 1-16

Author(s):

Duane S. Boning ◽

Ibrahim M. Elfadel ◽

Xin Li

Keyword(s):

Machine Learning ◽

Vlsi Cad

Efficient Process Variation Characterization by Virtual Probe

Machine Learning in VLSI Computer-Aided Design ◽

10.1007/978-3-030-04666-8_7 ◽

2019 ◽

pp. 201-231

Author(s):

Jun Tao ◽

Wangyang Zhang ◽

Xin Li ◽

Frank Liu ◽

Emrah Acar ◽

...

Keyword(s):

Process Variation ◽

Efficient Process

A Comparative Study of Assertion Mining Algorithms in GoldMine

Machine Learning in VLSI Computer-Aided Design ◽

10.1007/978-3-030-04666-8_20 ◽

2019 ◽

pp. 609-645

Author(s):

Shobha Vasudevan ◽

Lingyi Liu ◽

Samuel Hertz

Keyword(s):

Comparative Study ◽

Mining Algorithms

Fast Statistical Analysis of Rare Circuit Failure Events

Machine Learning in VLSI Computer-Aided Design ◽

10.1007/978-3-030-04666-8_12 ◽

2019 ◽

pp. 349-373

Author(s):

Jun Tao ◽

Shupeng Sun ◽

Xin Li ◽

Hongzhou Liu ◽

Kangsheng Luo ◽

...

Keyword(s):

Statistical Analysis

Extreme Statistics in Memories

Machine Learning in VLSI Computer-Aided Design ◽

10.1007/978-3-030-04666-8_10 ◽

2019 ◽

pp. 293-322

Author(s):

Amith Singhee

Keyword(s):

Extreme Statistics

Large-Scale Circuit Performance Modeling by Bayesian Model Fusion

Machine Learning in VLSI Computer-Aided Design ◽

10.1007/978-3-030-04666-8_14 ◽

2019 ◽

pp. 403-422

Author(s):

Jun Tao ◽

Fa Wang ◽

Paolo Cachecho ◽

Wangyang Zhang ◽

Shupeng Sun ◽

...

Keyword(s):

Bayesian Model ◽

Large Scale ◽

Performance Modeling ◽

Model Fusion ◽

Circuit Performance

Learning from Limited Data in VLSI CAD

Machine Learning in VLSI Computer-Aided Design ◽

10.1007/978-3-030-04666-8_13 ◽

2019 ◽

pp. 375-399

Author(s):

Li-C. Wang

Keyword(s):

Limited Data ◽

Vlsi Cad