2008 17th Asian Test Symposium
Latest Publications

TOTAL DOCUMENTS

96

(FIVE YEARS 0)

H-INDEX

10

(FIVE YEARS 0)

Published By IEEE

9780769533964

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Shared At-Speed BIST for Parallel Test of SRAMs with Different Address Sizes

2008 17th Asian Test Symposium ◽

10.1109/ats.2008.31 ◽

2008 ◽

Author(s):

Tomonori Sasaki ◽

Yoshiyuki Nakamura ◽

Toshiharu Asaka

Keyword(s):

Parallel Test

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Low Distortion Sine Waveform Generation by an AWG

2008 17th Asian Test Symposium ◽

10.1109/ats.2008.28 ◽

2008 ◽

Author(s):

Akinori Maeda

Keyword(s):

Waveform Generation ◽

Low Distortion

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Testing LCD Source Driver IC with Built-on-Scribe-Line Test Circuitry

2008 17th Asian Test Symposium ◽

10.1109/ats.2008.68 ◽

2008 ◽

Cited By ~ 2

Author(s):

Jui-Jer Huang ◽

Chiuan-Che Li ◽

Jiun-Lang Huang

Keyword(s):

Line Test

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Detectability of the Two-Dimensional Detector for Time Resolved Emission Measurement

2008 17th Asian Test Symposium ◽

10.1109/ats.2008.30 ◽

2008 ◽

Author(s):

Nobuyuki Hirai

Keyword(s):

Emission Measurement ◽

Two Dimensional ◽

Time Resolved

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Identifying Non-Robust Untestable RTL Paths in Circuits with Multi-cycle Paths

2008 17th Asian Test Symposium ◽

10.1109/ats.2008.55 ◽

2008 ◽

Author(s):

Thomas Edison Yu ◽

Tomokazu Yoneda ◽

Satoshi Ohtake ◽

Hideo Fujiwara

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Efficient Low-Cost Testing of Wireless OFDM Polar Transceiver Systems

2008 17th Asian Test Symposium ◽

10.1109/ats.2008.87 ◽

2008 ◽

Cited By ~ 4

Author(s):

Deuk Lee ◽

Vishwanath Natarajan ◽

Raj Senguttuvan ◽

Abhijit Chatterjee

Keyword(s):

Low Cost

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PHS-Fill: A Low Power Supply Noise Test Pattern Generation Technique for At-Speed Scan Testing in Huffman Coding Test Compression Environment

2008 17th Asian Test Symposium ◽

10.1109/ats.2008.63 ◽

2008 ◽

Cited By ~ 4

Author(s):

Yi-Tsung Lin ◽

Meng-Fan Wu ◽

Jiun-Lang Huang

Keyword(s):

Power Supply ◽

Test Pattern ◽

Pattern Generation ◽

Huffman Coding ◽

Test Pattern Generation ◽

Scan Testing ◽

Test Compression ◽

Generation Technique ◽

Supply Noise ◽

Noise Test

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Analyses on Trend of Accidents in Financial Information Systems Reported by Newspapers from the Viewpoint of Dependability

2008 17th Asian Test Symposium ◽

10.1109/ats.2008.65 ◽

2008 ◽

Cited By ~ 2

Author(s):

Koichi Bando ◽

Kenji Tanaka

Keyword(s):

Information Systems ◽

Financial Information ◽

Financial Information Systems

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Reliable Network-on-Chip Router for Crosstalk and Soft Error Tolerance

2008 17th Asian Test Symposium ◽

10.1109/ats.2008.35 ◽

2008 ◽

Cited By ~ 4

Author(s):

Ying Zhang ◽

Huawei Li ◽

Xiaowei Li

Keyword(s):

Network On Chip ◽

Soft Error ◽

Error Tolerance ◽

On Chip

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Load-Board/PCB Noise Suppression via Electromagnetic Band Gap Power Plane Patterning

2008 17th Asian Test Symposium ◽

10.1109/ats.2008.43 ◽

2008 ◽

Author(s):

Fidel Muradali ◽

Suzanne Huh ◽

Madhavan Swaminathan

Keyword(s):

Band Gap ◽

Noise Suppression ◽

Electromagnetic Band Gap

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