Build-in reliability analysis for circuit design in the nanometer technology era

The paper includes temperature measurement results on hybrid microelectronic circuit surfaces carried out by infrared microscope with special attention to critical temperatures (hot spots) which may require hybrid microelectronic circuit redesign. Critical component reliability analysis, as well as the need for replacement with more reliable components is considered. The principle for hybrid microelectronic design verification suggested.The paper is the result of longterm efforts at the Rudi Čajavec Factory in Banja Luka, where we have been investigating the possibilities for very reliable hybrid microelectronic circuit design.

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The Sun Radiometer Front-End Data Acquisition Circuit Design and Reliability Analysis

Journal of Computational Intelligence and Electronic Systems ◽

10.1166/jcies.2016.1126 ◽

2016 ◽

Vol 5 (1) ◽

pp. 63-69

Author(s):

Zhen Gong ◽

Shejiao Hu ◽

Dongdong Shi

Keyword(s):

Data Acquisition ◽

Reliability Analysis ◽

Circuit Design ◽

The Sun ◽

Front End

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A hierarchical reliability analysis for circuit design evaluation

IEEE Transactions on Electron Devices ◽

10.1109/16.725264 ◽

1998 ◽

Vol 45 (10) ◽

pp. 2254-2257 ◽

Cited By ~ 21

Author(s):

S.P. Riege ◽

C.V. Thompson ◽

J.J. Clement

Keyword(s):

Reliability Analysis ◽

Circuit Design ◽

Design Evaluation

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Gate-Level Circuit Reliability Analysis: A Survey

VLSI Design ◽

10.1155/2014/529392 ◽

2014 ◽

Vol 2014 ◽

pp. 1-12 ◽

Cited By ~ 9

Author(s):

Ran Xiao ◽

Chunhong Chen

Keyword(s):

Reliability Analysis ◽

Circuit Design ◽

Comparative Studies ◽

Research Interest ◽

Future Research ◽

Circuit Reliability ◽

The Future ◽

Pros And Cons ◽

Insight Into

Circuit reliability has become a growing concern in today’s nanoelectronics, which motivates strong research interest over the years in reliability analysis and reliability-oriented circuit design. While quite a few approaches for circuit reliability analysis have been reported, there is a lack of comparative studies on their pros and cons in terms of both accuracy and efficiency. This paper provides an overview of some typical methods for reliability analysis with focus on gate-level circuits, large or small, with or without reconvergent fanouts. It is intended to help the readers gain an insight into the reliability issues, and their complexity as well as optional solutions. Understanding the reliability analysis is also a first step towards advanced circuit designs for improved reliability in the future research.

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