2014 IEEE 20th International On-Line Testing Symposium (IOLTS)
Latest Publications

TOTAL DOCUMENTS

47

(FIVE YEARS 0)

H-INDEX

7

(FIVE YEARS 0)

Published By IEEE

9781479953240

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Effect of ionizing radiation on TRNGs for safe telecommunications: Robustness and randomness

2014 IEEE 20th International On-Line Testing Symposium (IOLTS) ◽

10.1109/iolts.2014.6873697 ◽

2014 ◽

Author(s):

H. Martin ◽

A. Vaskova ◽

C. Lopez-Ongil ◽

E. San Millan ◽

M. Portela-Garcia

Keyword(s):

Ionizing Radiation

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Area-efficient synthesis of fault-secure NoC switches

2014 IEEE 20th International On-Line Testing Symposium (IOLTS) ◽

10.1109/iolts.2014.6873662 ◽

2014 ◽

Author(s):

Atefe Dalirsani ◽

Michael A. Kochte ◽

Hans-Joachim Wunderlich

Keyword(s):

Efficient Synthesis ◽

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Power-aware optimization of software-based self-test for L1 caches in microprocessors

2014 IEEE 20th International On-Line Testing Symposium (IOLTS) ◽

10.1109/iolts.2014.6873688 ◽

2014 ◽

Author(s):

G. Theodorou ◽

N. Kranitis ◽

A. Paschalis ◽

D. Gizopoulos

Keyword(s):

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Pre-bond testing of weak defects in TSVs

2014 IEEE 20th International On-Line Testing Symposium (IOLTS) ◽

10.1109/iolts.2014.6873668 ◽

2014 ◽

Author(s):

Daniel Arumi ◽

Rosa Rodriguez-Montanes ◽

Joan Figueras

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Customized cell detector for laser-induced-fault detection

2014 IEEE 20th International On-Line Testing Symposium (IOLTS) ◽

10.1109/iolts.2014.6873669 ◽

2014 ◽

Author(s):

Feng Lu ◽

Giorgio Di Natale ◽

Marie-Lise Flottes ◽

Bruno Rouzeyre

Keyword(s):

Fault Detection

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Versatile architecture-level fault injection framework for reliability evaluation: A first report

2014 IEEE 20th International On-Line Testing Symposium (IOLTS) ◽

10.1109/iolts.2014.6873686 ◽

2014 ◽

Author(s):

Nikos Foutris ◽

Manolis Kaliorakis ◽

Sotiris Tselonis ◽

Dimitris Gizopoulos

Keyword(s):

Fault Injection ◽

Reliability Evaluation ◽

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Framework for economical error recovery in embedded cores

2014 IEEE 20th International On-Line Testing Symposium (IOLTS) ◽

10.1109/iolts.2014.6873687 ◽

2014 ◽

Author(s):

Gaurang Upasani ◽

Xavier Vera ◽

Antonio Gonzalez

Keyword(s):

Error Recovery ◽

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Multi-abstraction level signature generation and comparison based on radiation single event upset

2014 IEEE 20th International On-Line Testing Symposium (IOLTS) ◽

10.1109/iolts.2014.6873700 ◽

2014 ◽

Author(s):

C. Hobeika ◽

S. Pichette ◽

M. A. Leonard ◽

C. Thibeault ◽

J. F. Boland ◽

...

Keyword(s):

Single Event Upset ◽

Single Event ◽

Abstraction Level ◽

Signature Generation

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Error masking with approximate logic circuits using dynamic probability estimations

2014 IEEE 20th International On-Line Testing Symposium (IOLTS) ◽

10.1109/iolts.2014.6873685 ◽

2014 ◽

Author(s):

A. Sanchez-Clemente ◽

L. Entrena ◽

M. Garcia-Valderas

Keyword(s):

Logic Circuits ◽

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Modified DEC BCH codes for parallel correction of 3-bit errors comprising a pair of adjacent errors

2014 IEEE 20th International On-Line Testing Symposium (IOLTS) ◽

10.1109/iolts.2014.6873682 ◽

2014 ◽

Author(s):

Christian Badack ◽

Thomas Kern ◽

Michael Gossel

Keyword(s):

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