IEEE Transactions on Components Packaging and Manufacturing Technology Part C
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Published By Institute Of Electrical And Electronics Engineers

1558-1241, 1083-4400
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Front cover

1998 ◽  
Vol 21 (4) ◽  
pp. c1-c1 ◽  
Author(s):  
T.J. Maloney ◽  
K.K. Parat ◽  
N.K. Clark ◽  
A. Darwish
Keyword(s):  
Front Cover

Editorial

1998 ◽  
Vol 21 (4) ◽  
pp. 245-245 ◽  
Author(s):  
Walter J. Trybula

Influence of well profile and gate length on the ESD performance of a fully silicided 0.25 μm CMOS technology

1998 ◽  
Vol 21 (4) ◽  
pp. 286-294 ◽  
Author(s):  
Karlheinz Bock ◽  
Christian Russ ◽  
Goncal Badenes ◽  
Guido Groeseneken ◽  
Ludo Deferm
Keyword(s):  
Cmos Technology ◽  
Gate Length

Abstracts

1998 ◽  
Vol 21 (4) ◽  
pp. 246-248 ◽  
Author(s):  
H. Gieser ◽  
M. Haunschild

Protection of high voltage power and programming pins

1998 ◽  
Vol 21 (4) ◽  
pp. 250-256 ◽  
Author(s):  
Timothy J. Maloney ◽  
Krishna K. Parat ◽  
Neal K. Clark ◽  
Ali Darwish
Keyword(s):  
High Voltage
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