2010 11th Latin American Test Workshop
Latest Publications

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Published By IEEE

9781424477869, 9781424477852

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Automated test-bed for analog to digital converters

2010 11th Latin American Test Workshop ◽

10.1109/latw.2010.5550359 ◽

2010 ◽

Author(s):

Jose Erick de Souza Lima ◽

Carlos A. dos Reis Filho

Keyword(s):

Analog To Digital Converters ◽

Test Bed ◽

Analog To Digital ◽

Automated Test

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Test mode method and strategy for RF-based fault injection analysis for on-chip relaxation oscillators under EMC standard tests or RFI susceptibility characterization

2010 11th Latin American Test Workshop ◽

10.1109/latw.2010.5550382 ◽

2010 ◽

Cited By ~ 1

Author(s):

A. Olmos ◽

A. Vilas Boas ◽

E. R. da Silva ◽

J. C. Silva ◽

R. Maltione

Keyword(s):

Fault Injection ◽

Test Mode ◽

Relaxation Oscillators ◽

Mode Method ◽

On Chip ◽

Standard Tests

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Emulating an Agilent™ 4142 on a Keithley™ 2600 series Source Measurement Unit

2010 11th Latin American Test Workshop ◽

10.1109/latw.2010.5550376 ◽

2010 ◽

Author(s):

Jorge Moreno ◽

Osvaldo Gonzalez ◽

Rafael Vega ◽

Rogelio Palomera ◽

Manuel Jimenez

Keyword(s):

Measurement Unit

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Title page

2010 11th Latin American Test Workshop ◽

10.1109/latw.2010.5550365 ◽

2010 ◽

Keyword(s):

Title Page

Download Full-text

Dynamic power modulation in baseband OFDM signal processor using application driven metrics: Image transmission and processing

2010 11th Latin American Test Workshop ◽

10.1109/latw.2010.5550374 ◽

2010 ◽

Cited By ~ 3

Author(s):

Muhammad M. Nisar ◽

Jayaram Natarajan ◽

Abhijit Chatterjee

Keyword(s):

Image Transmission ◽

Dynamic Power ◽

Power Modulation ◽

Ofdm Signal ◽

Signal Processor

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A method for improving the radiation tolerance of PIN photodiodes by optimization of n− layer thickness and light wavelength

2010 11th Latin American Test Workshop ◽

10.1109/latw.2010.5550341 ◽

2010 ◽

Cited By ~ 1

Author(s):

A. P. Cedola ◽

M. A. Cappelletti ◽

E. L. Peltzer y Blanca

Keyword(s):

Layer Thickness ◽

Radiation Tolerance ◽

Light Wavelength ◽

Pin Photodiodes

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Experiments on the analysis of phase/frequency-modulated RF signals using digital tester channels

2010 11th Latin American Test Workshop ◽

10.1109/latw.2010.5550370 ◽

2010 ◽

Author(s):

N. Pous ◽

F. Azais ◽

L. Latorre ◽

P. Nouet ◽

J. Rivoir

Keyword(s):

Rf Signals

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BICS-based March test for resistive-open defect detection in SRAMs

2010 11th Latin American Test Workshop ◽

10.1109/latw.2010.5550342 ◽

2010 ◽

Cited By ~ 1

Author(s):

R. Chipana ◽

L. Bolzani ◽

F. Vargas

Keyword(s):

Defect Detection ◽

March Test ◽

Open Defect

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Reliability limits of TMR implemented in a SRAM-based FPGA: Heavy ion measures vs. fault injection predictions

2010 11th Latin American Test Workshop ◽

10.1109/latw.2010.5550337 ◽

2010 ◽

Cited By ~ 4

Author(s):

G. Foucard ◽

P. Peronnard ◽

R. Velazco

Keyword(s):

Fault Injection ◽

Heavy Ion

Download Full-text

2010 11th Latin American Test Workshop
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Automated test-bed for analog to digital converters

Test mode method and strategy for RF-based fault injection analysis for on-chip relaxation oscillators under EMC standard tests or RFI susceptibility characterization

Emulating an Agilent™ 4142 on a Keithley™ 2600 series Source Measurement Unit

Title page

Dynamic power modulation in baseband OFDM signal processor using application driven metrics: Image transmission and processing

A method for improving the radiation tolerance of PIN photodiodes by optimization of n− layer thickness and light wavelength

Experiments on the analysis of phase/frequency-modulated RF signals using digital tester channels

BICS-based March test for resistive-open defect detection in SRAMs

Reliability limits of TMR implemented in a SRAM-based FPGA: Heavy ion measures vs. fault injection predictions

Sponsors

Export Citation Format

2010 11th Latin American Test WorkshopLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Automated test-bed for analog to digital converters

Test mode method and strategy for RF-based fault injection analysis for on-chip relaxation oscillators under EMC standard tests or RFI susceptibility characterization

Emulating an Agilent™ 4142 on a Keithley™ 2600 series Source Measurement Unit

Title page

Dynamic power modulation in baseband OFDM signal processor using application driven metrics: Image transmission and processing

A method for improving the radiation tolerance of PIN photodiodes by optimization of n− layer thickness and light wavelength

Experiments on the analysis of phase/frequency-modulated RF signals using digital tester channels

BICS-based March test for resistive-open defect detection in SRAMs

Reliability limits of TMR implemented in a SRAM-based FPGA: Heavy ion measures vs. fault injection predictions

Sponsors

2010 11th Latin American Test Workshop
Latest Publications