2017 IEEE Radiation Effects Data Workshop (REDW)
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68
(FIVE YEARS 0)

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3
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Published By IEEE

9781509046478
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Proton and Heavy Ion Testing of the Microsemi Igloo2 FPGA

2017 ◽  
Author(s):  
S. C. Davis ◽  
R. Koga ◽  
J. S. George
Keyword(s):  
Heavy Ion

Radiation Testing of a Flash NAND Device

2017 ◽  
Author(s):  
D. L. Hansen ◽  
F. Meraz ◽  
J. Montoya ◽  
S. Roberg ◽  
G. Williamson
Keyword(s):  
Radiation Testing

SEU Characterization of an Embedded 130nm Compiled SRAM in Heavy Ion and Proton Environments

2017 ◽  
Author(s):  
Matt Von Thun ◽  
Dale Walz ◽  
Radu Dumitru ◽  
Anthony Wilson ◽  
Teresa Farris
Keyword(s):  
Heavy Ion

64 MeV Proton Single-Event Upset Characterization of Customer Memory Interface Design on Xilinx XCKU040 FPGA

2017 ◽  
Author(s):  
Yanran P. Chen ◽  
Pierre Maillard ◽  
Michael Hart ◽  
Jeff Barton ◽  
John Schmitz ◽  
...  
Keyword(s):  
Interface Design ◽  
Single Event Upset ◽  
Single Event ◽  
Memory Interface

Displacement Damage Testing of the Intersil ISL70023SEH and ISL70024SEH Gallium Nitride Power Transistors

2017 ◽  
Author(s):  
N. W. van Vonno ◽  
O. Mansilla ◽  
J. S. Gill ◽  
W. H. Newman ◽  
L. G. Pearce ◽  
...  
Keyword(s):  
Gallium Nitride ◽  
Displacement Damage ◽  
Power Transistors
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