2017 IEEE Radiation Effects Data Workshop (REDW)
Latest Publications

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68

(FIVE YEARS 0)

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3

(FIVE YEARS 0)

Published By IEEE

9781509046478

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Radiation Testing of a Flash NAND Device

2017 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/nsrec.2017.8115486 ◽

2017 ◽

Author(s):

D. L. Hansen ◽

F. Meraz ◽

J. Montoya ◽

S. Roberg ◽

G. Williamson

Keyword(s):

Radiation Testing

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SEU Characterization of an Embedded 130nm Compiled SRAM in Heavy Ion and Proton Environments

2017 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/nsrec.2017.8115462 ◽

2017 ◽

Author(s):

Matt Von Thun ◽

Dale Walz ◽

Radu Dumitru ◽

Anthony Wilson ◽

Teresa Farris

Keyword(s):

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Towards a Qualification Data Set: Expanded SEE Data on the P2020 Processor

2017 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/nsrec.2017.8115453 ◽

2017 ◽

Author(s):

Steven M. Guertin ◽

Sergeh Vartanian

Keyword(s):

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Compendium of Single Event Transient (SET) and Total Ionizing Dose (TID) Test Results for Commonly Used Voltage Comparators

2017 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/nsrec.2017.8115430 ◽

2017 ◽

Author(s):

Amanda N. Bozovich ◽

Farokh Irom

Keyword(s):

Test Results ◽

Single Event ◽

Total Ionizing Dose ◽

Single Event Transient

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Proton and Heavy Ion Testing of the Microsemi Igloo2 FPGA

2017 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/nsrec.2017.8115454 ◽

2017 ◽

Author(s):

S. C. Davis ◽

R. Koga ◽

J. S. George

Keyword(s):

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Destructive Single-Event Effects Testing of the Intersil ISL70023SEH and ISL70024SEH Gallium Nitride power transistors

2017 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/nsrec.2017.8115470 ◽

2017 ◽

Author(s):

N. W. van Vonno ◽

O. Mansilla ◽

J. S. Gill ◽

W. H. Newman ◽

L. G. Pearce ◽

...

Keyword(s):

Gallium Nitride ◽

Single Event ◽

Single Event Effects ◽

Power Transistors

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Configuration Tests of RHBD Library with DICE, TAG4, dual rail, TMR and New 10T Voting Latch using UMC 65 and XFAB 180 nm

2017 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/nsrec.2017.8115483 ◽

2017 ◽

Author(s):

Robert L. Shuler

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2017 Compendium of Recent Test Results of Single Event Effects Conducted by the Jet Propulsion Laboratory's Radiation Effects Group

2017 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/nsrec.2017.8115429 ◽

2017 ◽

Author(s):

Gregory R. Allen ◽

Sergeh Vartanian ◽

Farokh Irom ◽

Leif Z. Scheick ◽

Philippe Adell ◽

...

Keyword(s):

Radiation Effects ◽

Test Results ◽

Single Event ◽

Single Event Effects ◽

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Recent Radiation Test Results for Trench Power MOSFETs

2017 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/nsrec.2017.8115473 ◽

2017 ◽

Author(s):

Jean-Marie Lauenstein ◽

Megan C. Casey ◽

Edward P. Wilcox ◽

Anthony M. Phan ◽

Hak S. Kim ◽

...

Keyword(s):

Test Results ◽

Power Mosfets ◽

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64 MeV Proton Single-Event Upset Characterization of Customer Memory Interface Design on Xilinx XCKU040 FPGA

2017 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/nsrec.2017.8115450 ◽

2017 ◽

Author(s):

Yanran P. Chen ◽

Pierre Maillard ◽

Michael Hart ◽

Jeff Barton ◽

John Schmitz ◽

...

Keyword(s):

Interface Design ◽

Single Event Upset ◽

Single Event ◽

Memory Interface

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