Compendium of Single Event Transient (SET) and Total Ionizing Dose (TID) Test Results for Commonly Used Voltage Comparators

2017 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/nsrec.2017.8115430 ◽

2017 ◽

Author(s):

Amanda N. Bozovich ◽

Farokh Irom

Keyword(s):

Test Results ◽

Single Event ◽

Total Ionizing Dose ◽

Single Event Transient

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NASA Goddard Space Flight Center’s Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results

2019 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2019.8906647 ◽

2019 ◽

Author(s):

Alvson D. Topper ◽

Edward J. Wyrwas ◽

Kaitlyn Ryder ◽

Kenneth A. LaBel ◽

Jonathan A. Pellish ◽

...

Keyword(s):

Space Flight ◽

Test Results ◽

Single Event ◽

Total Ionizing Dose ◽

Displacement Damage ◽

Single Event Effects ◽

Damage Dose ◽

Nasa Goddard Space ◽

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Compendium of Total Ionizing Dose, Displacement Damage and Single Event Transient Test Data of Various Optocouplers for ESA

2013 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/redw.2013.6658192 ◽

2013 ◽

Author(s):

Marc Poizat ◽

Maryse Sauvagnac ◽

Anne Samaras ◽

Yannick Padie ◽

Pierre Garcia ◽

...

Keyword(s):

Test Data ◽

Single Event ◽

Total Ionizing Dose ◽

Single Event Transient ◽

Displacement Damage

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Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial and Radiation Tolerant Operational Amplifiers

2014 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/redw.2014.7004561 ◽

2014 ◽

Author(s):

Farokh Irom ◽

Shri G. Agarwal ◽

Mehran Amrbar

Keyword(s):

Operational Amplifiers ◽

Test Results ◽

Single Event ◽

Total Ionizing Dose ◽

Radiation Tolerant ◽

Single Event Latchup

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Megarad total ionizing dose and single event effects test results of a radhard-by-design 0.25 micron ASIC [space applications]

2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) ◽

10.1109/redw.2004.1352914 ◽

2005 ◽

Author(s):

M. Hartwell ◽

C. Hafer ◽

P. Milliken ◽

T. Farris

Keyword(s):

Test Results ◽

Single Event ◽

Total Ionizing Dose ◽

Space Applications ◽

Single Event Effects

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Impact of Total Ionizing Dose on the Analog Single Event Transient Sensitivity of a Linear Bipolar Integrated Circuit

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2007.910229 ◽

2007 ◽

Vol 54 (6) ◽

pp. 2534-2540 ◽

Author(s):

M. F. Bernard ◽

L. Dusseau ◽

S. Buchner ◽

D. McMorrow ◽

R. Ecoffet ◽

...

Keyword(s):

Integrated Circuit ◽

Single Event ◽

Total Ionizing Dose ◽

Single Event Transient ◽

Bipolar Integrated Circuit

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Single Event Transient and ELDRS Characterization Test Results for LM4050QML 2.5V Precision Reference

2010 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2010.5619582 ◽

2010 ◽

Author(s):

Kirby Kruckmeyer ◽

Elisa Morozumi ◽

Robert Eddy ◽

Thang Trinh ◽

Tom Santiago ◽

...

Keyword(s):

Test Results ◽

Single Event ◽

Single Event Transient ◽

Characterization Test

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Total-Ionizing Dose and Single-Event Effect Test Results of Analog and Mixed Signal Devices from Analog Devices

2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) ◽

10.1109/nsrec.2018.8584309 ◽

2018 ◽

Author(s):

Dakai Chen ◽

Tom Decker ◽

Andy Mo ◽

Jonathan Harris ◽

Nathan Wendel ◽

...

Keyword(s):

Test Results ◽

Single Event ◽

Total Ionizing Dose ◽

Mixed Signal ◽

Single Event Effect ◽

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Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial Digital to Analog Converters

2015 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/redw.2015.7336706 ◽

2015 ◽

Author(s):

Farokh Irom ◽

Shri G. Agarwal

Keyword(s):

Test Results ◽

Single Event ◽

Total Ionizing Dose ◽

Digital To Analog Converters ◽

Digital To Analog ◽

Single Event Latchup

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Total Ionizing dose and single event effects test results of a Radiation Hardness-by-Design Library for 0.15μm fully depleted SOI-AISC

2009 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2009.5994729 ◽

2009 ◽

Author(s):

A. Makihara ◽

T. Ebihara ◽

T. Yokose ◽

Y. Tsuchiya ◽

Y. Miyazaki ◽

...

Keyword(s):

Radiation Hardness ◽

Test Results ◽

Single Event ◽

Total Ionizing Dose ◽

Fully Depleted ◽

Single Event Effects

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Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial Analog to Digital Converters

2012 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2012.6353729 ◽

2012 ◽

Author(s):

Farokh Irom ◽

Shri G. Agarwal

Keyword(s):

Analog To Digital Converters ◽

Test Results ◽

Single Event ◽

Total Ionizing Dose ◽

Analog To Digital ◽

Single Event Latchup

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