64 MeV Proton Single-Event Upset Characterization of Customer Memory Interface Design on Xilinx XCKU040 FPGA

2017 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/nsrec.2017.8115450 ◽

2017 ◽

Author(s):

Yanran P. Chen ◽

Pierre Maillard ◽

Michael Hart ◽

Jeff Barton ◽

John Schmitz ◽

...

Keyword(s):

Interface Design ◽

Single Event Upset ◽

Single Event ◽

Memory Interface

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Neutron, 64 MeV Proton, Thermal Neutron and Alpha Single-Event Upset Characterization of Xilinx 20nm UltraScale Kintex FPGA

2015 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/redw.2015.7336723 ◽

2015 ◽

Author(s):

Pierre Maillard ◽

Michael Hart ◽

Jeff Barton ◽

Praful Jain ◽

James Karp

Keyword(s):

Thermal Neutron ◽

Single Event Upset ◽

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Single Event Upset Characterization of the Zynq-7000 ARM® Cortex™-A9 Processor Unit Using Proton Irradiation

2015 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/redw.2015.7336735 ◽

2015 ◽

Author(s):

David M. Hiemstra ◽

Valeri Kirischian

Keyword(s):

Proton Irradiation ◽

Single Event Upset ◽

Single Event ◽

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Dynamic single event upset characterization of the virtex-IIPro's embedded IBM PowerPC405 using proton irradiation

IEEE Radiation Effects Data Workshop, 2005. ◽

10.1109/redw.2005.1532665 ◽

2005 ◽

Author(s):

F. Chayab ◽

D.M. Hiemstra ◽

R. Ronge

Keyword(s):

Proton Irradiation ◽

Single Event Upset ◽

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Single Event Upset Characterization of the Virtex-5 Field Programmable Gate Array Using Proton Irradiation

2010 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2010.5619490 ◽

2010 ◽

Author(s):

David M. Hiemstra ◽

George Battiston ◽

Prab Gill

Keyword(s):

Field Programmable Gate Array ◽

Proton Irradiation ◽

Single Event Upset ◽

Single Event ◽

Field Programmable ◽

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Single event upset characterization of the ESP603 single board space computer with the PowerPC603R processor using proton irradiation

IEEE Radiation Effects Data Workshop, 2005. ◽

10.1109/redw.2005.1532668 ◽

2005 ◽

Author(s):

H. Rufenacht ◽

D.M. Hiemstra ◽

R. Ronge ◽

T. Klincsek ◽

Kim Anh Le ◽

...

Keyword(s):

Proton Irradiation ◽

Single Event Upset ◽

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Single Event Upset Characterization of the Stratix IV Field Programmable Gate Array using Proton Irradiation

2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) ◽

10.1109/nsrec.2018.8584320 ◽

2018 ◽

Author(s):

Qingyu Chen ◽

Li Chen ◽

David M. Hiemstra ◽

Valeri Kirischian

Keyword(s):

Field Programmable Gate Array ◽

Proton Irradiation ◽

Single Event Upset ◽

Single Event ◽

Field Programmable ◽

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Single Event Upset Characterization of the Tegra K1 Mobile Processor Using Proton Irradiation

2017 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/nsrec.2017.8115446 ◽

2017 ◽

Author(s):

Haibin Wang ◽

Qingyu Chen ◽

Li Chen ◽

David M. Hiemstra ◽

Valeri Kirischian

Keyword(s):

Proton Irradiation ◽

Single Event Upset ◽

Single Event ◽

Mobile Processor

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Single Event Upset Characterization of the Virtex-4 Field Programmable Gate Array Using Proton Irradiation

2006 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2006.295476 ◽

2006 ◽

Author(s):

David Hiemstra ◽

Fayez Chayab ◽

Zaeem Mohammed

Keyword(s):

Field Programmable Gate Array ◽

Proton Irradiation ◽

Single Event Upset ◽

Single Event ◽

Field Programmable ◽

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Proton-induced single event upset characterization of a 1 Giga-sample per second analog to digital converter

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) ◽

10.1109/radecs.1999.858575 ◽

2003 ◽

Author(s):

R.A. Reed ◽

P.W. Marshall ◽

M.A. Carts ◽

G.L. Henegar ◽

R.B. Katz

Keyword(s):

Single Event Upset ◽

Analog To Digital Converter ◽

Single Event ◽

Digital Converter ◽

Analog To Digital

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Single Event Upset Characterization of the Zynq UltraScale+ MPSoC Using Proton Irradiation

2017 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/nsrec.2017.8115448 ◽

2017 ◽

Author(s):

David M. Hiemstra ◽

Valeri Kirischian ◽

Jakub Brelski

Keyword(s):

Proton Irradiation ◽

Single Event Upset ◽

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