2014 15th International Conference on Ultimate Integration on Silicon (ULIS)
Latest Publications

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Published By IEEE

9781479937189

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Cu nanolines for application in RF interconnects

2014 15th International Conference on Ultimate Integration on Silicon (ULIS) ◽

10.1109/ulis.2014.6813920 ◽

2014 ◽

Cited By ~ 3

Author(s):

Panagiotis Sarafis ◽

Philippe Benech ◽

Androula G. Nassiopoulou

Keyword(s):

Rf Interconnects

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Mismatch trends in 20nm gate-last bulk CMOS technology

2014 15th International Conference on Ultimate Integration on Silicon (ULIS) ◽

10.1109/ulis.2014.6813916 ◽

2014 ◽

Cited By ~ 1

Author(s):

Lama Rahhal ◽

Aurelie Bajolet ◽

Jean-Philippe Manceau ◽

Julien Rosa ◽

Stephane Ricq ◽

...

Keyword(s):

Cmos Technology

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Multiphysics modeling of thin piezoelectric transducers integrated in flexible substrates

2014 15th International Conference on Ultimate Integration on Silicon (ULIS) ◽

10.1109/ulis.2014.6813910 ◽

2014 ◽

Cited By ~ 1

Author(s):

G. Ardila ◽

R. Tao ◽

L. Montes ◽

M. Mouis

Keyword(s):

Piezoelectric Transducers ◽

Flexible Substrates ◽

Multiphysics Modeling

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Assessment of technological device parameters by low-frequency noise investigation in SOI omega-gate nanowire NMOS FETs

2014 15th International Conference on Ultimate Integration on Silicon (ULIS) ◽

10.1109/ulis.2014.6813905 ◽

2014 ◽

Cited By ~ 3

Author(s):

M. Koyama ◽

M. Casse ◽

S. Barraud ◽

G. Ghibaudo ◽

H. Iwai ◽

...

Keyword(s):

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise

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Challenges in suspending CVD graphene: More than capillary effects

2014 15th International Conference on Ultimate Integration on Silicon (ULIS) ◽

10.1109/ulis.2014.6813899 ◽

2014 ◽

Cited By ~ 1

Author(s):

O. I. Aydin ◽

T. Hallam ◽

J. L. Thomassin ◽

M. Mouis ◽

G. Duesberg

Keyword(s):

Capillary Effects ◽

Cvd Graphene

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Tensile strained Ge membranes

2014 15th International Conference on Ultimate Integration on Silicon (ULIS) ◽

10.1109/ulis.2014.6813917 ◽

2014 ◽

Cited By ~ 1

Author(s):

V. A. Shah ◽

O. Trushkevych ◽

M. Myronov ◽

S. Rhead ◽

J. Halpin ◽

...

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Conformal mapping based DC current model for double gate tunnel FETs

2014 15th International Conference on Ultimate Integration on Silicon (ULIS) ◽

10.1109/ulis.2014.6813922 ◽

2014 ◽

Cited By ~ 6

Author(s):

Arnab Biswas ◽

Luca De Michielis ◽

Cem Alper ◽

Adrian M. Ionescu

Keyword(s):

Conformal Mapping ◽

Current Model ◽

Double Gate ◽

Tunnel Fets ◽

Dc Current

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2014 15th International Conference on Ultimate Integration on Silicon (ULIS) ◽

10.1109/ulis.2014.6813889 ◽

2014 ◽

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Sensitivity of carrier mobility to edge defects in ultra-narrow graphene nanoribbons

2014 15th International Conference on Ultimate Integration on Silicon (ULIS) ◽

10.1109/ulis.2014.6813900 ◽

2014 ◽

Cited By ~ 2

Author(s):

M. Poljak ◽

K. L. Wang ◽

T. Suligoj

Keyword(s):

Carrier Mobility ◽

Graphene Nanoribbons ◽

Edge Defects

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Two-dimensional modeling of an ultra-thin body single-gate Si Tunnel-FET

2014 15th International Conference on Ultimate Integration on Silicon (ULIS) ◽

10.1109/ulis.2014.6813926 ◽

2014 ◽

Cited By ~ 6

Author(s):

Michael Graef ◽

Thomas Holtij ◽

Franziska Hain ◽

Alexander Kloes ◽

Benjamin Iniguez

Keyword(s):

Thin Body ◽

Two Dimensional ◽

Dimensional Modeling ◽

Tunnel Fet

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2014 15th International Conference on Ultimate Integration on Silicon (ULIS)
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Cu nanolines for application in RF interconnects

Mismatch trends in 20nm gate-last bulk CMOS technology

Multiphysics modeling of thin piezoelectric transducers integrated in flexible substrates

Assessment of technological device parameters by low-frequency noise investigation in SOI omega-gate nanowire NMOS FETs

Challenges in suspending CVD graphene: More than capillary effects

Tensile strained Ge membranes

Conformal mapping based DC current model for double gate tunnel FETs

Table of contents

Sensitivity of carrier mobility to edge defects in ultra-narrow graphene nanoribbons

Two-dimensional modeling of an ultra-thin body single-gate Si Tunnel-FET

Export Citation Format

2014 15th International Conference on Ultimate Integration on Silicon (ULIS)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Cu nanolines for application in RF interconnects

Mismatch trends in 20nm gate-last bulk CMOS technology

Multiphysics modeling of thin piezoelectric transducers integrated in flexible substrates

Assessment of technological device parameters by low-frequency noise investigation in SOI omega-gate nanowire NMOS FETs

Challenges in suspending CVD graphene: More than capillary effects

Tensile strained Ge membranes

Conformal mapping based DC current model for double gate tunnel FETs

Table of contents

Sensitivity of carrier mobility to edge defects in ultra-narrow graphene nanoribbons

Two-dimensional modeling of an ultra-thin body single-gate Si Tunnel-FET

2014 15th International Conference on Ultimate Integration on Silicon (ULIS)
Latest Publications