Hot Carrier Degradation in Semiconductor Devices
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Published By Springer International Publishing

9783319089935, 9783319089942
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

From Atoms to Circuits: Theoretical and Empirical Modeling of Hot Carrier Degradation

2014 ◽  
pp. 3-27
Author(s):  
William McMahon ◽  
Yoann Mamy-Randriamihaja ◽  
Balaji Vaidyanathan ◽  
Tanya Nigam ◽  
Ninad Pimparkar
Keyword(s):  
Empirical Modeling ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Reliability Simulation Models for Hot Carrier Degradation

2014 ◽  
pp. 477-517 ◽  
Author(s):  
A. J. Scholten ◽  
B. De Vries ◽  
J. Bisschop ◽  
G. T. Sasse
Keyword(s):  
Simulation Models ◽  
Hot Carrier ◽  
Hot Carrier Degradation

The Energy Driven Hot Carrier Model

2014 ◽  
pp. 29-56 ◽  
Author(s):  
Stewart E. Rauch ◽  
Fernando Guarin
Keyword(s):  
Hot Carrier ◽  
Carrier Model
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