Recovery from Hot Carrier Induced Degradation Through Temperature Treatment

Author(s):  
Gregor Pobegen
1981 ◽  
Vol 42 (C7) ◽  
pp. C7-51-C7-56
Author(s):  
K. Aoki ◽  
T. Kobayashi ◽  
K. Yamamoto

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-779-C4-782 ◽  
Author(s):  
C. BERGONZONI ◽  
R. BENECCHI ◽  
P. CAPRARA

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-787-C4-790
Author(s):  
P. T.J. BIERMANS ◽  
T. POORTER ◽  
H. J.H. MERKS-EPPINGBROEK

2020 ◽  
Vol 5 (1) ◽  
Author(s):  
Aulia Alfi

Virgin Coconut Oil (VCO) adalah bahan alami yang memiliki sifat antimikroba (antivirus, antibakteri, dan antijamur). Sehingga VCO dapat memberikan efek pengawet pada bahan makanan, salah satunya adalah roti manis. Penelitian ini dilakukan untuk mengevaluasi pengaruh VCO terhadap karakteristik (fisik dan kimia) dan umur simpan roti manis. Roti manis dianalisis secara fisik (tekstur dan porositas) dan kimia (kadar air, kadar abu, kadar lemak, kadar protein, dan kandungan karbohidrat), dan analisis umur simpan dengan FFA, uji organoleptik dan jamur setiap dua hari selama delapan hari penyimpanan di suhu ruang. Variasi perlakuan roti manis adalah dari rasio konsentrasi VCO: margarin: mentega, K (0%: 8%: 8%); A (4%: 6%: 6%); B (8%: 4%: 4%), C (12%: 2%: 2%); D (16%: 0%: 0%). Hasil penelitian menunjukkan bahwa VCO tidak memiliki pengaruh yang signifikan terhadap karakteristik fisik dan karakteristik kimia roti manis. Namun, VCO berpengaruh signifikan terhadap kadar air roti manis yang dihasilkan, roti manis K memiliki kadar air tertinggi (22,36%) dan berbeda dengan sampel roti manis lainnya. VCO secara efektif menghambat pertumbuhan jamur di roti manis pada konsentrasi 8%, 12%, dan 16%. Roti manis K dan A memiliki masa simpan 4 hari, sedangkan roti manis B, C, dan D memiliki masa simpan 6 hari.Kata kunci: VCO, roti manis, karakteristik, umur simpanABSTRACTVirgin Coconut Oil (VCO) is a natural ingredient that has antimicrobial (antiviral, antibacterial, and antifungal) properties. So that VCO can provide a preservative effect on food ingredients, one of which is sweet bread. This research was conducted to evaluate the effect of VCO on characteristics (physical and chemical) and shelf life of sweet bread. Sweet bread was analyzed physically (texture and porosity) and chemistry (moisture content, ash content, fat content, protein content, and carbohydrate content), and shelf life analysis with FFA, organoleptic and mold tests every two days for eight days of storage at ambient temperature. Treatment variations of sweet breads is from the ratio of the concentration of VCO: margarine: butter, K (0%: 8%: 8%); A (4%: 6%: 6%); B (8%: 4%: 4%), C (12%: 2%: 2%); D (16%: 0%: 0%). The results showed that VCO did not have a significant effect on the physical characteristics and chemical characteristics of sweet bread. However, the VCO has a significant effect on the water content of the sweet bread produced, sweet bread K has the highest moisture content (22,36%) and it is different from other sweet bread samples. VCO effectively inhibits the growth of sweet bread mold at concentrations of 8%, 12%, and 16%. K and A sweet bread has a shelf life of 4 days, while sweet breads B, C, and D have a shelf life of 6 days.Keywords: VCO, sweet bread, characteristics, shelf life


Author(s):  
Franco Stellari ◽  
Peilin Song ◽  
James C. Tsang ◽  
Moyra K. McManus ◽  
Mark B. Ketchen

Abstract Hot-carrier luminescence emission is used to diagnose the cause of excess quiescence current, IDDQ, in a low power circuit implemented in CMOS 7SF technology. We found by optical inspection of the chip that the high IDDQ is related to the low threshold, Vt, device process and in particular to transistors with minimum channel length (0.18 μm). In this paper we will also show that it is possible to gain knowledge regarding the operating conditions of the IC from the analysis of optical emission due to leakage current, aside from simply locating defects and failures. In particular, we will show how it is possible to calculate the voltage drop across the circuit power grid from time-integrated acquisitions of leakage luminescence.


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