Circuit Reliability: Hot-Carrier Stress of MOS Transistors in Different Fields of Application

2014 ◽  
pp. 445-476 ◽  
Author(s):  
Christian Schlünder
Keyword(s):  
Circuit Reliability ◽  
Mos Transistors ◽  
Hot Carrier ◽  
Hot Carrier Stress

Current-accelerated channel hot carrier stress of MOS transistors

1998 ◽  
Vol 34 (2) ◽  
pp. 217 ◽  
Author(s):  
Chih-Tang Sah ◽  
A. Neugroschel ◽  
K.M. Han
Keyword(s):  
Mos Transistors ◽  
Hot Carrier ◽  
Hot Carrier Stress

HOT CARRIER STRESS INDUCED CHANGES IN MOST TRANSCONDUCTANCE STRUCTURE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-779-C4-782 ◽  
Author(s):  
C. BERGONZONI ◽  
R. BENECCHI ◽  
P. CAPRARA
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Induced Changes

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs

2017 ◽  
Vol 74 ◽  
pp. 74-80 ◽  
Author(s):  
Lihua Dai ◽  
Xiaonian Liu ◽  
Mengying Zhang ◽  
Leqing Zhang ◽  
Zhiyuan Hu ◽  
...  
Keyword(s):  
Short Channel ◽  
Hot Carrier ◽  
Hot Carrier Stress

Hot-carrier stress damage in the gate 'off' state in n-channel transistors

1992 ◽  
Vol 39 (7) ◽  
pp. 1774-1776 ◽  
Author(s):  
B.S. Doyle ◽  
K.R. Mistry
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Stress Damage

Hot Carrier Stress Effects of SiO2 Passivated AlGaN/GaN High Electron Mobility Transistors

2019 ◽  
Vol 3 (5) ◽  
pp. 213-220 ◽  
Author(s):  
Min-Woo Ha ◽  
Young-Hwan Choi ◽  
Joon-Hyun Park ◽  
Kwang-Seok Seo ◽  
Min-Koo Han
Keyword(s):  
Electron Mobility ◽  
High Electron Mobility Transistors ◽  
High Electron ◽  
High Electron Mobility ◽  
Hot Carrier ◽  
Stress Effects ◽  
Electron Mobility Transistors ◽  
Hot Carrier Stress
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