2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual
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1424409187, 1424409195
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On the Interaction Between Inter-Metal Dielectric Reliability and Electromigration Stress

2007 ◽  
Author(s):  
Yunlong Li ◽  
Christophe Bruynseraede ◽  
Guido Groeseneken ◽  
Karen Maex ◽  
Zsolt Tokei

Moisture Related Low-K Dielectric Reliability Before and After Thermal Annealing

2007 ◽  
Author(s):  
Yunlong Li ◽  
Ivan Ciofi ◽  
Laureen Carbonell ◽  
Guido Groeseneken ◽  
Karen Maex ◽  
...  
Keyword(s):  
Thermal Annealing ◽  
Before And After ◽  
Low K

Reliability and Processing Effects of Bandgap Engineered SONOS (BE-SONOS) Flash Memory

2007 ◽  
Author(s):  
Szu-Yu Wang ◽  
Hang-Ting Lue ◽  
Erh-Kun Lai ◽  
Ling-Wu Yang ◽  
Tahone Yang ◽  
...  
Keyword(s):  
Flash Memory ◽  
Processing Effects
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