An Investigation of Self-Heating Degradation of Metal Induced Laterally Crystallized N-Type Polysilicon Thin Film Transistors
2003 ◽
Vol 42
(Part 1, No. 7A)
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pp. 4213-4217
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2007 ◽
Vol 54
(12)
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pp. 3276-3284
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2012 ◽
Vol 59
(12)
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pp. 3389-3395
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