Progress in SOI Structures and Devices Operating at Extreme Conditions
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Published By Springer Netherlands

9781402005763, 9789401003391
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

DC and AC Models of Partially-Depleted SOI MOSFETs in Weak Inversion

2002 ◽  
pp. 289-298
Author(s):  
Daniel Tomaszewski ◽  
Krzysztof Domański ◽  
Lidia Łukasiak ◽  
Agnieszka Zaręba ◽  
Jan Gibki ◽  
...  
Keyword(s):  
Weak Inversion

Radiation Effects in SOI Magnetic Sensitive Elements Under Different Radiation Conditions

2002 ◽  
pp. 221-227
Author(s):  
A. D. Mokrushin ◽  
N. M. Omeljanovskaja ◽  
A. V. Leonov ◽  
V. N. Mordkovich ◽  
D. M. Pazhin
Keyword(s):  
Radiation Effects ◽  
Radiation Conditions

On Scaling the Thin Film Si Thickness of SOI Substrates

2002 ◽  
pp. 299-308 ◽  
Author(s):  
K. D. Hobart ◽  
F. J. Kub ◽  
M. E. Twigg ◽  
M. Fatemi
Keyword(s):  
Thin Film ◽  
Soi Substrates

Defects and their Electronic Properties in High-Pressure-Annealed SOI Structures Sliced by Hydrogen

2002 ◽  
pp. 269-288 ◽  
Author(s):  
V. P. Popov ◽  
A. K. Gutakovskii ◽  
L. N. Safronov ◽  
I. E. Tyschenko ◽  
S. K. Zhuravlev ◽  
...  
Keyword(s):  
High Pressure ◽  
Electronic Properties

Low-Noise High-Temperature SOI Analog Circuits

2002 ◽  
pp. 189-209 ◽  
Author(s):  
V. Dessard ◽  
B. Iniguez ◽  
S. Adriaensen ◽  
D. Flandre
Keyword(s):  
High Temperature ◽  
Analog Circuits ◽  
Low Noise
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