Advances in X-Ray Analysis
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Published By Springer US

9780306450457, 9781461517979
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

An In SituXRD Technique For Annealing Investigations

1995 ◽  
pp. 757-762
Author(s):  
D. E. Hoylman ◽  
S. C. Axtell ◽  
B. W. Robertson

X-ray Fractography On Fatigue Fractured Surface Of Austenitic Stainless Steel

1995 ◽  
pp. 443-453
Author(s):  
Zenjiro Yajima ◽  
Hideki. Tokuyama ◽  
Yasuo. Kibayashi ◽  
Yukio Hirose
Keyword(s):  
Stainless Steel ◽  
Austenitic Stainless Steel ◽  
X Ray ◽  
Fractured Surface

Combined Xrd and Xrf Analysis for Portable and Remote Applications

1995 ◽  
pp. 319-324 ◽  
Author(s):  
Jonathan A. Kerner ◽  
Edward D. Franco ◽  
John Marshall
Keyword(s):  
Xrf Analysis

Fluorine Implantation and Residual Stresses in Polysilicon Films

1995 ◽  
pp. 235-242
Author(s):  
Lynn. Lowry ◽  
Paul Zschack ◽  
Robert De Angelis
Keyword(s):  
Residual Stresses ◽  
Polysilicon Films

The Characterisation of Microtexture by Orientation Mapping

1995 ◽  
pp. 547-550 ◽  
Author(s):  
R. A. Schwarzer ◽  
S. Zaefferer ◽  
K. Kunze
Keyword(s):  
Orientation Mapping
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