2011 IEEE ICMTS International Conference on Microelectronic Test Structures
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9781424485260, 9781424485291
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Novel BJT test structure for high-performance matching characteristics in CMOS-based analog applications

2011 ◽  
Author(s):  
Yi-Jung Jung ◽  
Byoung-Seok Park ◽  
In-Shik Han ◽  
Hyuk-Min Kwon ◽  
Sang-Uk Park ◽  
...  
Keyword(s):  
High Performance ◽  
Test Structure

Interdigitated electrode modelling for applications in dielectrophoresis

2011 ◽  
Author(s):  
C. Chung ◽  
S. Smith ◽  
A. Menachery ◽  
P. Bagnaninchi ◽  
A. J. Walton ◽  
...  
Keyword(s):  
Interdigitated Electrode

Device variability and correlation control by automated tuning of SPICE cards to PCM measurements

2011 ◽  
Author(s):  
Alberto Revelant ◽  
Luca Lucci ◽  
Luca Selmi ◽  
Benno Ankele
Keyword(s):  
Automated Tuning

Modeling the frequency dependence of MOSFET gate capacitance

2011 ◽  
Author(s):  
Zeqin Zhu ◽  
Gennady Gildenblat ◽  
Colin C. McAndrew ◽  
Ik-Sung Lim
Keyword(s):  
Frequency Dependence ◽  
Gate Capacitance

Design of a test chip with small embedded temperature sensor structures realized in a common-drain power trench technology

2011 ◽  
Author(s):  
Helmut Kock ◽  
Robert Illing ◽  
Thomas Ostermann ◽  
Stefan Decker ◽  
Donald Dibra ◽  
...  
Keyword(s):  
Temperature Sensor ◽  
Test Chip

Matching characteristics of metal resistors

2011 ◽  
Author(s):  
Hiroaki Namba ◽  
Takasuke Hashimoto ◽  
Kenji Hayashi ◽  
Masayuki Furumiya
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