Applied Scanning Probe Methods III - NanoScience and Technology
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11

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2

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Published By Springer Berlin Heidelberg

9783540269090, 9783540269106

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Surface Characterization and Adhesion and Friction Properties of Hydrophobic Leaf Surfaces and Nanopatterned Polymers for Superhydrophobic Surfaces

Applied Scanning Probe Methods III - NanoScience and Technology ◽

10.1007/3-540-26910-x_3 ◽

2006 ◽

pp. 55-81

Author(s):

Zachary Burton ◽

Bharat Bhushan

Keyword(s):

Surface Characterization ◽

Superhydrophobic Surfaces ◽

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Scanning Probe Microscopy: From Living Cells to the Subatomic Range

Applied Scanning Probe Methods III - NanoScience and Technology ◽

10.1007/3-540-26910-x_2 ◽

2006 ◽

pp. 27-53

Author(s):

Ille C. Gebeshuber ◽

Manfred Drack ◽

Friedrich Aumayr ◽

Hannspeter Winter ◽

Friedrich Franek

Keyword(s):

Scanning Probe Microscopy ◽

Living Cells ◽

Scanning Probe ◽

Probe Microscopy

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AFM Applications for Contact and Wear Simulation

Applied Scanning Probe Methods III - NanoScience and Technology ◽

10.1007/3-540-26910-x_9 ◽

2006 ◽

pp. 299-326 ◽

Author(s):

Nikolai K. Myshkin ◽

Mark I. Petrokovets ◽

Alexander V. Kovalev

Keyword(s):

Wear Simulation

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Scanning Probe Methods in the Magnetic Tape Industry

Applied Scanning Probe Methods III - NanoScience and Technology ◽

10.1007/3-540-26910-x_11 ◽

2006 ◽

pp. 343-369 ◽

Author(s):

James K. Knudsen

Keyword(s):

Magnetic Tape ◽

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One- and Two-Dimensional Systems: Scanning Tunneling Microscopy and Spectroscopy of Organic and Inorganic Structures

Applied Scanning Probe Methods III - NanoScience and Technology ◽

10.1007/3-540-26910-x_6 ◽

2006 ◽

pp. 183-215

Author(s):

Luca Gavioli ◽

Massimo Sancrotti

Keyword(s):

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Two Dimensional ◽

Tunneling Microscopy

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AFM Applications for Analysis of Fullerene-Like Nanoparticles

Applied Scanning Probe Methods III - NanoScience and Technology ◽

10.1007/3-540-26910-x_10 ◽

2006 ◽

pp. 327-342

Author(s):

Lev Rapoport ◽

Armen Verdyan

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Investigation of Organic Supramolecules by Scanning Probe Microscopy in Ultra-High Vacuum

Applied Scanning Probe Methods III - NanoScience and Technology ◽

10.1007/3-540-26910-x_5 ◽

2006 ◽

pp. 131-182

Author(s):

Laurent Nony ◽

Enrico Gnecco ◽

Ernst Meyer

Keyword(s):

Scanning Probe Microscopy ◽

High Vacuum ◽

Ultra High Vacuum ◽

Scanning Probe ◽

Probe Microscopy

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Scanning Probe Microscopy Applied to Ferroelectric Materials

Applied Scanning Probe Methods III - NanoScience and Technology ◽

10.1007/3-540-26910-x_7 ◽

2006 ◽

pp. 217-259 ◽

Author(s):

Oleg Tikhomirov ◽

Massimiliano Labardi ◽

Maria Allegrini

Keyword(s):

Scanning Probe Microscopy ◽

Ferroelectric Materials ◽

Scanning Probe ◽

Probe Microscopy

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Probing Macromolecular Dynamics and the Influence of Finite Size Effects

Applied Scanning Probe Methods III - NanoScience and Technology ◽

10.1007/3-540-26910-x_4 ◽

2006 ◽

pp. 83-130 ◽

Author(s):

Scott Sills ◽

René M. Overney

Keyword(s):

Size Effects ◽

Finite Size ◽

Finite Size Effects ◽

Macromolecular Dynamics

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Morphological and Tribological Characterization of Rough Surfaces by Atomic Force Microscopy

Applied Scanning Probe Methods III - NanoScience and Technology ◽

10.1007/3-540-26910-x_8 ◽

2006 ◽

pp. 261-298 ◽

Author(s):

Renato Buzio ◽

Ugo Valbusa

Keyword(s):

Atomic Force Microscopy ◽

Rough Surfaces ◽

Force Microscopy ◽

Atomic Force ◽

Tribological Characterization

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