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80th ARFTG Microwave Measurement Conference
Latest Publications
TOTAL DOCUMENTS
19
(FIVE YEARS 0)
H-INDEX
3
(FIVE YEARS 0)
Published By IEEE
9781467348188, 9781467348171, 9781467348201
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Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
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Comparison of power ratio and vector network analyzer techniques for measuring attenuation
80th ARFTG Microwave Measurement Conference
◽
10.1109/arftg.2012.6422438
◽
2012
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Cited By ~ 1
Author(s):
Caitlin Chirgwin
◽
Thomas P. Crowley
◽
Weihai Fang
◽
Denis X. LeGolvan
Keyword(s):
Vector Network Analyzer
◽
Power Ratio
◽
Network Analyzer
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A neural network approach to smooth calibrated data corrupted from switching errors
80th ARFTG Microwave Measurement Conference
◽
10.1109/arftg.2012.6422428
◽
2012
◽
Author(s):
Andres Zarate-de Landa
◽
M. A. Pulido-Gaytan
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J.A. Reynoso-Hernandez
◽
Patrick Roblin
◽
J.R. Loo-Yau
Keyword(s):
Neural Network
◽
Network Approach
◽
Neural Network Approach
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Sensitivity analysis of wafer-level over-temperature RF calibration
80th ARFTG Microwave Measurement Conference
◽
10.1109/arftg.2012.6422427
◽
2012
◽
Cited By ~ 3
Author(s):
A. Rumiantsev
◽
G. Fisher
◽
R. Doerner
Keyword(s):
Sensitivity Analysis
◽
Wafer Level
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Hybrid multi-harmonic load- and source-pull system
80th ARFTG Microwave Measurement Conference
◽
10.1109/arftg.2012.6422433
◽
2012
◽
Cited By ~ 1
Author(s):
J. Essing
◽
F.A. Malekzadeh
◽
A. van Roermund
◽
R. Mahmoudi
Keyword(s):
Harmonic Load
◽
Pull System
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A procedure for measurement of s-parameters and eye-diagram of backplane using two-port VNA
80th ARFTG Microwave Measurement Conference
◽
10.1109/arftg.2012.6422421
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2012
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Author(s):
Karel Hoffmann
◽
Martin Randus
Keyword(s):
Eye Diagram
◽
S Parameters
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Pulsed RF calibration for NVNA measurements
80th ARFTG Microwave Measurement Conference
◽
10.1109/arftg.2012.6422437
◽
2012
◽
Cited By ~ 4
Author(s):
Patrick Roblin
◽
Youngseo Ko
◽
Haedong Jang
◽
Jean Pierre Teyssier
Keyword(s):
Pulsed Rf
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Method for obtaining noise parameters using a vector network analyzer with an integrated noise receiver
80th ARFTG Microwave Measurement Conference
◽
10.1109/arftg.2012.6422439
◽
2012
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Cited By ~ 1
Author(s):
Roger D. Hayward
Keyword(s):
Vector Network Analyzer
◽
Network Analyzer
◽
Noise Parameters
◽
Noise Receiver
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Stochastic model and drift dependence of long term stability of type N precision coaxial terminations
80th ARFTG Microwave Measurement Conference
◽
10.1109/arftg.2012.6422436
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2012
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Author(s):
Yeou Song Lee
Keyword(s):
Stochastic Model
◽
Term Stability
◽
Long Term Stability
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Characterizing WR-8 waveguide-to-CPW probes using two methods implemented within the NIST Uncertainty Framework
80th ARFTG Microwave Measurement Conference
◽
10.1109/arftg.2012.6422429
◽
2012
◽
Cited By ~ 9
Author(s):
Jeffrey A. Jargon
◽
Uwe Arz
◽
Dylan F. Williams
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60 GHz mixed signal active load-pull system for millimeter wave devices characterization
80th ARFTG Microwave Measurement Conference
◽
10.1109/arftg.2012.6422434
◽
2012
◽
Cited By ~ 3
Author(s):
L. Galatro
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M. Marchetti
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M. Spirito
Keyword(s):
Millimeter Wave
◽
60 Ghz
◽
Mixed Signal
◽
Pull System
◽
Active Load
◽
Load Pull
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