2020 IEEE 38th VLSI Test Symposium (VTS)
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9781728153599
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

SafeTPU: A Verifiably Secure Hardware Accelerator for Deep Neural Networks

2020 ◽  
Author(s):  
Maria I. Mera Collantes ◽  
Zahra Ghodsi ◽  
Siddharth Garg
Keyword(s):  
Neural Networks ◽  
Deep Neural Networks ◽  
Hardware Accelerator ◽  
Secure Hardware

A Deterministic-Statistical Multiple-Defect Diagnosis Methodology

2020 ◽  
Author(s):  
Soumya Mittal ◽  
R. D. Shawn Blanton
Keyword(s):  
Multiple Defect ◽  
Defect Diagnosis

scholarly journals DFSSD: Deep Faults and Shallow State Duality, A Provably Strong Obfuscation Solution for Circuits with Restricted Access to Scan Chain

2020 ◽  
Author(s):  
Shervin Roshanisefat ◽  
Hadi Mardani Kamali ◽  
Kimia Zamiri Azar ◽  
Sai Manoj Pudukotai Dinakarrao ◽  
Naghmeh Karimi ◽  
...  
Keyword(s):  
Restricted Access ◽  
Deep Faults ◽  
Scan Chain ◽  
Shallow State

Co-Optimization of Grid-Based TAM Wire Routing and Test Scheduling with Reconfigurable Wrappers

2020 ◽  
Author(s):  
Jui-Hung Hung ◽  
Shih-Hsu Huang ◽  
Chun-Hua Cheng ◽  
Hsu-Yu Kao ◽  
Wei-Kai Cheng
Keyword(s):  
Test Scheduling ◽  
Wire Routing ◽  
Grid Based

A New Secure Scan Design with PUF-based Key for Authentication

2020 ◽  
Author(s):  
Qidong Wang ◽  
Aijiao Cui ◽  
Gang Qu ◽  
Huawei Li
Keyword(s):  
Scan Design

Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects

2020 ◽  
Author(s):  
Somayeh Sadeghi-Kohan ◽  
Sybille Hellebrand
Keyword(s):  
Test Method ◽  
Frequency Test
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