Remaining useful life estimation for thermally aged power insulated gate bipolar transistors based on a modified maximum likelihood estimator

Author(s):  
Adla Ismail ◽  
Lotfi Saidi ◽  
Mounir Sayadi ◽  
Mohamed Benbouzid
Author(s):  
Hazim Mansour Gorgees ◽  
Bushra Abdualrasool Ali ◽  
Raghad Ibrahim Kathum

     In this paper, the maximum likelihood estimator and the Bayes estimator of the reliability function for negative exponential distribution has been derived, then a Monte –Carlo simulation technique was employed to compare the performance of such estimators. The integral mean square error (IMSE) was used as a criterion for this comparison. The simulation results displayed that the Bayes estimator performed better than the maximum likelihood estimator for different samples sizes.


2020 ◽  
Vol 14 ◽  
Author(s):  
Dangbo Du ◽  
Jianxun Zhang ◽  
Xiaosheng Si ◽  
Changhua Hu

Background: Remaining useful life (RUL) estimation is the central mission to the complex systems’ prognostics and health management. During last decades, numbers of developments and applications of the RUL estimation have proliferated. Objective: As one of the most popular approaches, stochastic process-based approach has been widely used for characterizing the degradation trajectories and estimating RULs. This paper aimed at reviewing the latest methods and patents on this topic. Methods: The review is concentrated on four common stochastic processes for degradation modelling and RUL estimation, i.e., Gamma process, Wiener process, inverse Gaussian process and Markov chain. Results: After a briefly review of these four models, we pointed out the pros and cons of them, as well as the improvement direction of each method. Conclusion: For better implementation, the applications of these four approaches on maintenance and decision-making are systematically introduced. Finally, the possible future trends are concluded tentatively.


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