Effect of C60 ion sputtering on the compositional depth profiling in XPS for Li(Ni,Co,Mn)O2 electrodes

2011 ◽  
Vol 258 (3) ◽  
pp. 1279-1281 ◽  
Author(s):  
Li-Shin Chang ◽  
Yi-Chun Lin ◽  
Ching-Yi Su ◽  
Hung-Chun Wu ◽  
Jing-Pin Pan
Keyword(s):  
Depth Profiling ◽  
Ion Sputtering ◽  
Compositional Depth Profiling

scholarly journals Compositional depth profiling of diamond-like carbon layers by glow discharge optical emission spectroscopy

2016 ◽  
Vol 31 (11) ◽  
pp. 2207-2212 ◽  
Author(s):  
C. Schubert ◽  
V. Hoffmann ◽  
A. Kümmel ◽  
J. Sinn ◽  
M. Härtel ◽  
...  
Keyword(s):  
Glow Discharge ◽  
Emission Spectroscopy ◽  
Optical Emission Spectroscopy ◽  
Depth Profiling ◽  
Optical Emission ◽  
Optical Emission Spectrometry ◽  
Emission Spectrometry ◽  
Diamond Like Carbon ◽  
Compositional Depth Profiling

This article describes the compositional depth profiling (CDP) of diamond-like carbon (DLC) layers by Glow Discharge-Optical Emission Spectrometry (GD-OES).

Depth profile analysis with glow discharge spectrometry

2017 ◽  
Vol 32 (5) ◽  
pp. 920-930 ◽  
Author(s):  
Lara Lobo ◽  
Beatriz Fernández ◽  
Rosario Pereiro
Keyword(s):  
Glow Discharge ◽  
Depth Profile ◽  
Profile Analysis ◽  
Depth Profiling ◽  
Depth Profile Analysis ◽  
Compositional Depth Profiling

Glow discharge spectrometry shows excellent capabilities for fast compositional depth profiling of modern and challenging materials.

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