GALENO : Computer Aided System for Modeling, Monitoring and Control in Anesthesia†

Author(s):  
Bertinho A. Costa ◽  
Teresa Mendonça
2012 ◽  
pp. 1043-1063 ◽  
Author(s):  
Chinmay K Maiti ◽  
Ananda Maiti

Since Technology Computer Aided Design (TCAD) is an important component of modern semiconductor manufacturing, a new framework is needed for microelectronics education. An integrated measurement-based microelectronics and VLSI engineering laboratory with simulation-based technology CAD laboratory is described. An Internet-based laboratory management system for monitoring and control of a real-time measurement system interfaced via a dedicated local computer is discussed. The management system allows the remote students to conduct remote experiments, perform monitoring and control of the experimental setup, and collect data from the experiment through the network link as if the student is physically in a conventional laboratory. The management system is also capable of evaluating of a student’s performance and grading laboratory courses that involve preliminary quiz and viva-voce examinations, checking of experimental data and submitted online laboratory reports. The proposed online TCAD teaching methodology will provide an opportunity for expanding microelectronics education.


Author(s):  
M. Minhat ◽  
X.W. Xu

Computer Numerical Control (CNC) systems are the “backbones” of modern manufacturing industry for over the last 50 years and the machine tools have evolved from simple machines with controllers that had no memory and were driven by punched tape, to today’s highly sophisticated, multiprocess workstations. These CNC systems are still being worked and improved on. The key issues center on autonomous planning, decision making, process monitoring and control systems that can adjust automatically to the changeable requirements. Introduction of CNC systems has made it possible to produce goods with consistent qualities, apart from enabling the industry to enhance productivity with a high degree of flexibility in a manufacturing system. CNC systems sit at the end of the process starting from product design using Computer Aided Design (CAD) tools to the generation of machining instructions that instruct a CNC machine to produce the final product. This process chain also includes Computer Aided Process Planning (CAPP) and Computer Aided Manufacturing (CAM).


Author(s):  
Chinmay K Maiti ◽  
Ananda Maiti

Since Technology Computer Aided Design (TCAD) is an important component of modern semiconductor manufacturing, a new framework is needed for microelectronics education. An integrated measurement-based microelectronics and VLSI engineering laboratory with simulation-based technology CAD laboratory is described. An Internet-based laboratory management system for monitoring and control of a real-time measurement system interfaced via a dedicated local computer is discussed. The management system allows the remote students to conduct remote experiments, perform monitoring and control of the experimental setup, and collect data from the experiment through the network link as if the student is physically in a conventional laboratory. The management system is also capable of evaluating of a student’s performance and grading laboratory courses that involve preliminary quiz and viva-voce examinations, checking of experimental data and submitted online laboratory reports. The proposed online TCAD teaching methodology will provide an opportunity for expanding microelectronics education.


Author(s):  
David C. Joy

Personal computers (PCs) are a powerful resource in the EM Laboratory, both as a means of automating the monitoring and control of microscopes, and as a tool for quantifying the interpretation of data. Not only is a PC more versatile than a piece of dedicated data logging equipment, but it is also substantially cheaper. In this tutorial the practical principles of using a PC for these types of activities will be discussed.The PC can form the basis of a system to measure, display, record and store the many parameters which characterize the operational conditions of the EM. In this mode it is operating as a data logger. The necessary first step is to find a suitable source from which to measure each of the items of interest. It is usually possible to do this without having to make permanent corrections or modifications to the EM.


2016 ◽  
Author(s):  
Giacomo Giannoccaro ◽  
Armando Ursitti ◽  
Maurizio Prosperi

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