scholarly journals Ex Situ Residual Stress Analysis of Chemical Vapor Deposited Diamond Coated Cutting Tools by Synchrotron X‐Ray Diffraction in Transmission Geometry

2021 ◽  
pp. 2001525
Author(s):  
Daniel Hinzmann ◽  
Katrin Böttcher ◽  
Walter Reimers ◽  
Eckart Uhlmann
2013 ◽  
Vol 46 (5) ◽  
pp. 1323-1330 ◽  
Author(s):  
M. Meixner ◽  
M. Klaus ◽  
Ch. Genzel ◽  
W. Reimers

Chemical vapour deposition (CVD) of diamond surface layers is an effective way of improving the properties of cemented carbide cutting tools. Inadequate coating adhesion is one of the main issues and it may be affected by the residual stresses of the CVD diamond films. The most common methods for nondestructive residual stress analysis are based on X-ray diffraction. The present paper deals with the particular case of determining the residual stress state of thin CVD diamond layers deposited on cobalt cemented tungsten carbide (WC–Co) substrates. It will be shown that the application of the conventional sin2ψ method might lead to erroneous results, as a result of superimposing diffraction lines originating from cobalt and the diamond coating. An approach to separating information on the substrate and film, based on grazing conditions in the symmetrical Ψ mode of diffraction, is presented. The results, revealing large compressive stresses within the coating, are compared with those obtained by supplementary micro-Raman spectroscopy investigations.


2006 ◽  
Vol 421 (1-2) ◽  
pp. 1-8 ◽  
Author(s):  
B. Benedikt ◽  
M. Lewis ◽  
P. Rangaswamy ◽  
M. Kumosa ◽  
P. Predecki ◽  
...  

2013 ◽  
Vol 768-769 ◽  
pp. 420-427 ◽  
Author(s):  
Jeremy Epp ◽  
Thilo Pirling ◽  
Thomas Hirsch

In this paper the microstructural and residual-stress analysis of an induction hardened plate of medium carbon steel is described. The stress gradient was determined using laboratory X-ray diffraction (IWT, Bremen, Germany) and neutron strain scanning (ILL, Grenoble, France). Due to slight variations of chemical composition in the depth, matchstick like (cross section 2×2mm²) d0-reference samples were prepared from a similarly treated sample. The d0shift induced by variation of chemical composition was measured by neutron and by X-ray diffraction along the strain free direction (sin²ψ*) and used for the evaluation of the neutron stress calculation. The d0distribution obtained from the neutron measurement did not appear reliable while the method using X-ray diffraction seems to be an efficient and reliable method to determine d0profiles in small samples. The evaluation of neutron measurements was then done using the X-ray diffraction d0distribution. High compressive residual stresses were measured in the hardened layer followed by high tensile residual stresses in the core. A comparison of the neutron measurements with X-ray diffraction (XRD) depth profiles obtained after successive layer removal showed that both methods give similar results. However, these investigations opened the question about the direct comparison of the residual stresses obtained by neutron and XRD. Indeed, a correction of the neutron data regarding the residual stresses in thickness direction might be necessary as these are released in the case of X-ray diffraction measurements after layer removal.


2005 ◽  
Vol 45 (1) ◽  
pp. 83-88 ◽  
Author(s):  
J. C. P. Pina ◽  
A. M. Dias ◽  
P. F. P. de Matos ◽  
P. M. G. P. Moreira ◽  
P. M. S. T. de Castro

Vacuum ◽  
2020 ◽  
Vol 177 ◽  
pp. 109371 ◽  
Author(s):  
Wenrui Wang ◽  
Lihong Yuan ◽  
Yun Li ◽  
Mengyao Yang ◽  
Hui Zhang ◽  
...  

2016 ◽  
Vol 106 ◽  
pp. 495-496
Author(s):  
J.P. Oliveira ◽  
F.M. Braz Fernandes ◽  
R.M. Miranda ◽  
N. Schell ◽  
J.L. Ocaña

Sign in / Sign up

Export Citation Format

Share Document