Structure refinement with X-ray powder diffraction data for synthetic calcium hydroxyapatite by Rietveld method

1985 ◽  
Vol 20 (7) ◽  
pp. 957-960 ◽  
Author(s):  
W. Pritzkow ◽  
H. Rentsch
Keyword(s):  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Structure Refinement ◽  
Calcium Hydroxyapatite ◽  
Powder Diffraction Data ◽  
X Ray

Structure Refinement of High-Density Polyethylene Using X-Ray Powder Diffraction Data and the Rietveld Method

1995 ◽  
Vol 39 ◽  
pp. 515-521
Author(s):  
Kenneth B. Schwartz ◽  
Robert B. Von Dreele
Keyword(s):  
Powder Diffraction ◽  
Diffraction Data ◽  
High Density Polyethylene ◽  
Rietveld Method ◽  
Structure Refinement ◽  
High Density ◽  
Powder Diffraction Data ◽  
X Ray ◽  
Voigt Profile ◽  
Full Structure

A full structure analysis of a completely crystallized sample of high-density polyethylene (HDPE) has been achieved using x-ray powder diffraction data collected on a laboratory-based powder diffractometer. The structure refinement is performed using the Rietveld method and includes refinement of the carbon and hydrogen atomic positions and temperature factors. The C-C and C-H bond distances and the C-C-C bond angle along the polyethylene chain have been calculated from the refined atomic positions and are in very good agreement with previous experimental and modelling determinations. Evaluations of the pseudo-Voigt profile parameters for Lorentzian strain broadening and me Scherrer coefficient for Gaussian broadening yield reasonable values for microstrain and particle size for this sample. Refinement of the preferred orientation parameter indicates that the HDPE flakes consist of platy crystals or lamellae that are packed normal to the diffraction vector.

X-Ray Powder Diffraction Data and Crystal Refinement of Ternary Compound Ti4ZrSi3

2020 ◽  
Vol 841 ◽  
pp. 99-102
Author(s):  
Liu Qing Liang ◽  
Yan Ying Wei ◽  
De Gui Li
Keyword(s):  
Ternary Compound ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Structure Refinement ◽  
Structure Type ◽  
Hexagonal Structure ◽  
Powder Diffraction Data ◽  
Tungsten Electrode ◽  
X Ray

Ternary compound Ti4ZrSi3 was prepared by arc melting using a non-consumable tungsten electrode under argon atmosphere, then annealed at 1023K for 30 days, the X-ray powder diffraction data of Ti4ZrSi3 was collected on a Rigaku SmartLab X-ray powder diffractometer. The powder patterns of the compound were indexed and structure refinement by using Rietveld method indicate that the Ti4ZrSi3 compound crystallizes in the hexagonal structure, space group P6/mcm (No.193) with Mn5Si3 structure type, a=b=7.5759(3) Ǻ, c=5.2162(2) Ǻ, V=259.28Ǻ3, Z=2, ρx=4.779g cm-3, the Smith–Snyder FOM F30=148.7(0.0064, 46) and the intensity ratio RIR=1.37. The Rietveld refinement results were Rp = 0.0836, Rwp= 0.1092.

X-Ray Powder Diffraction Data and Crystal Refinement of a New Compound AlCrNi3Pr

2016 ◽  
Vol 850 ◽  
pp. 3-7
Author(s):  
Shu Hui Liu ◽  
Liu Qing Liang ◽  
Chang Sheng Qin ◽  
De Gui Li ◽  
Ling Min Zeng ◽  
...  
Keyword(s):  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Structure Refinement ◽  
Structure Type ◽  
Hexagonal Structure ◽  
Powder Diffraction Data ◽  
Tungsten Electrode ◽  
X Ray ◽  
Diffraction Patterns

Rare earth-transition metal (R-T) intermetallics have been well used because of their excellent properties. The X-ray diffraction patterns of many new phases in the R-T system have not been extensively studied. A new compound AlCrNi3Pr was prepared by arc melting using non-consumable tungsten electrode under argon atmosphere, and then annealed at 1023K for 30 days. The X-ray powder diffraction data of AlCrNi3Pr was collected on a Rigaku SmartLab X-ray powder diffractometer. The powder patterns of the compound were indexed, and the structure refinement by using Rietveld method indicated that the AlCrNi3Pr compound crystallized in the hexagonal structure, space group P6/mmm (No.191) with PrNi5 structure type, a=b=5.0553(9) Ǻ, c=4.0763(6) Ǻ, V=90.22Ǻ3, Z=1, ρx=7.288g cm-3, the Smith–Snyder FOM F30=279.1(0.0044, 32) and the intensity ratio RIR=1.23.

Rietveld Structure Refinement of Metastable Lithium Disilicate Using Synchrotron X-Ray Powder Diffraction Data From the Daresbury SRS 8.3 Diffractometer

1990 ◽  
Vol 5 (3) ◽  
pp. 137-143 ◽  
Author(s):  
R.I. Smith ◽  
A.R. West ◽  
I. Abrahams ◽  
P.G. Bruce
Keyword(s):  
Crystal Structure ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Structure Refinement ◽  
Powder Diffraction Data ◽  
X Ray ◽  
New Instrument ◽  
Diffraction Peaks

AbstractThe crystal structure of metastable Li2Si2O5, Fw = 150.05, has been refined by the Rietveld method using high resolution X-ray powder diffraction data recorded at the Daresbury Synchrotron Radiation Source on the new 8.3 diffractometer. Li2Si2O5, in keeping with many compounds of interest to the materials scientist, exhibits relatively broad diffraction peaks. It is important to establish the quality of crystal structure data that may be obtained from such materials on this new instrument. Various functions were used to model the peak shape from this instrument; a split-Pearson VII function appeared to be marginally superior to Pearson VII or Pseudo-Voigt functions. Refinement was carried out using the split-Pearson VII in the space group Pbcn (60) and terminated with a = 5.6871(6), b = 4.7846(5), c = 14.645(1) Å, V = 398.50 Å3, Z=4, Dc= 2.502 gcm−3, Rwp = 17.06, Rex = 14.48 and Χ2 = 1.39. The refined parameters are compared with those obtained from a previous single crystal X-ray determination.

X-ray powder diffraction data and structural study of Fe2GeSe4

1998 ◽  
Vol 13 (4) ◽  
pp. 196-201 ◽  
Author(s):  
J. A. Henao ◽  
J. M. Delgado ◽  
M. Quintero
Keyword(s):  
Diffraction Pattern ◽  
Structural Study ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Room Temperature ◽  
Rietveld Method ◽  
Structure Refinement ◽  
Powder Diffraction Data ◽  
Space Group ◽  
X Ray

The room temperature X-ray powder diffraction pattern of Fe2GeSe4, a II2 □ IV VI4 semiconducting compound, has been recorded and evaluated. This material was found to be orthorhombic, a=13.069(1), b=7.559(1), c=6.2037(6) Å, V=612.83(9) Å3, Z=4, Dx=5.42 gcm−3. The structure refinement carried out using the Rietveld method indicated that this material crystallizes in space group Pnma (No. 62) with an olivine type of structure. The refinement of 33 parameters led to RWP=15.3%, RP=10.2% for 5251 step intensities and RB=9.44% and RF=9.36% for 913 reflections.

Crystallographic study of ternary ordered skutterudite IrGe1.5Se1.5

2010 ◽  
Vol 25 (3) ◽  
pp. 247-252 ◽  
Author(s):  
F. Laufek ◽  
J. Návrátil
Keyword(s):  
Crystal Structure ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Crystallographic Data ◽  
Powder Diffraction Data ◽  
X Ray ◽  
Crystallographic Study ◽  
Related Phase ◽  
The Ideal

The crystal structure of skutterudite-related phase IrGe1.5Se1.5 has been refined by the Rietveld method from laboratory X-ray powder diffraction data. Refined crystallographic data for IrGe1.5Se1.5 are a=12.0890(2) Å, c=14.8796(3) Å, V=1883.23(6) Å3, space group R3 (No. 148), Z=24, and Dc=8.87 g/cm3. Its crystal structure can be derived from the ideal skutterudite structure (CoAs3), where Se and Ge atoms are ordered in layers perpendicular to the [111] direction of the original skutterudite cell. Weak distortions of the anion and cation sublattices were also observed.

Rietveld Refinement of the BaTiO3 from X-Ray Powder Diffraction

2009 ◽  
Vol 79-82 ◽  
pp. 593-596
Author(s):  
Feng Sun ◽  
Yan Sheng Yin
Keyword(s):  
Rietveld Refinement ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Structural Parameters ◽  
Ferroelectric Ceramic ◽  
Powder Diffraction Data ◽  
Ceramic Powders ◽  
Space Group ◽  
X Ray

The ferroelectric ceramic BaTiO3 was synthesized at 1000 °C for 5 h. The structure of the system under study was refined on the basis of X-ray powder diffraction data using the Rietveld method. The system crystallizes in the space group P4mm（99）. The refinement of instrumental and structural parameters led to reliable values for the Rp, Rwp and Rexp.We use the TOPAS software of Bruker AXS to refine this ceramic powders and show its conformation

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