Rietveld Structure Refinement of Metastable Lithium Disilicate Using Synchrotron X-Ray Powder Diffraction Data From the Daresbury SRS 8.3 Diffractometer

1990 ◽  
Vol 5 (3) ◽  
pp. 137-143 ◽  
Author(s):  
R.I. Smith ◽  
A.R. West ◽  
I. Abrahams ◽  
P.G. Bruce
Keyword(s):  
Crystal Structure ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Structure Refinement ◽  
Powder Diffraction Data ◽  
X Ray ◽  
New Instrument ◽  
Diffraction Peaks

AbstractThe crystal structure of metastable Li2Si2O5, Fw = 150.05, has been refined by the Rietveld method using high resolution X-ray powder diffraction data recorded at the Daresbury Synchrotron Radiation Source on the new 8.3 diffractometer. Li2Si2O5, in keeping with many compounds of interest to the materials scientist, exhibits relatively broad diffraction peaks. It is important to establish the quality of crystal structure data that may be obtained from such materials on this new instrument. Various functions were used to model the peak shape from this instrument; a split-Pearson VII function appeared to be marginally superior to Pearson VII or Pseudo-Voigt functions. Refinement was carried out using the split-Pearson VII in the space group Pbcn (60) and terminated with a = 5.6871(6), b = 4.7846(5), c = 14.645(1) Å, V = 398.50 Å3, Z=4, Dc= 2.502 gcm−3, Rwp = 17.06, Rex = 14.48 and Χ2 = 1.39. The refined parameters are compared with those obtained from a previous single crystal X-ray determination.

Crystallographic study of ternary ordered skutterudite IrGe1.5Se1.5

2010 ◽  
Vol 25 (3) ◽  
pp. 247-252 ◽  
Author(s):  
F. Laufek ◽  
J. Návrátil
Keyword(s):  
Crystal Structure ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Crystallographic Data ◽  
Powder Diffraction Data ◽  
X Ray ◽  
Crystallographic Study ◽  
Related Phase ◽  
The Ideal

The crystal structure of skutterudite-related phase IrGe1.5Se1.5 has been refined by the Rietveld method from laboratory X-ray powder diffraction data. Refined crystallographic data for IrGe1.5Se1.5 are a=12.0890(2) Å, c=14.8796(3) Å, V=1883.23(6) Å3, space group R3 (No. 148), Z=24, and Dc=8.87 g/cm3. Its crystal structure can be derived from the ideal skutterudite structure (CoAs3), where Se and Ge atoms are ordered in layers perpendicular to the [111] direction of the original skutterudite cell. Weak distortions of the anion and cation sublattices were also observed.

Structure Refinement of High-Density Polyethylene Using X-Ray Powder Diffraction Data and the Rietveld Method

1995 ◽  
Vol 39 ◽  
pp. 515-521
Author(s):  
Kenneth B. Schwartz ◽  
Robert B. Von Dreele
Keyword(s):  
Powder Diffraction ◽  
Diffraction Data ◽  
High Density Polyethylene ◽  
Rietveld Method ◽  
Structure Refinement ◽  
High Density ◽  
Powder Diffraction Data ◽  
X Ray ◽  
Voigt Profile ◽  
Full Structure

A full structure analysis of a completely crystallized sample of high-density polyethylene (HDPE) has been achieved using x-ray powder diffraction data collected on a laboratory-based powder diffractometer. The structure refinement is performed using the Rietveld method and includes refinement of the carbon and hydrogen atomic positions and temperature factors. The C-C and C-H bond distances and the C-C-C bond angle along the polyethylene chain have been calculated from the refined atomic positions and are in very good agreement with previous experimental and modelling determinations. Evaluations of the pseudo-Voigt profile parameters for Lorentzian strain broadening and me Scherrer coefficient for Gaussian broadening yield reasonable values for microstrain and particle size for this sample. Refinement of the preferred orientation parameter indicates that the HDPE flakes consist of platy crystals or lamellae that are packed normal to the diffraction vector.

X-Ray Powder Diffraction Data and Crystal Refinement of Ternary Compound Ti4ZrSi3

2020 ◽  
Vol 841 ◽  
pp. 99-102
Author(s):  
Liu Qing Liang ◽  
Yan Ying Wei ◽  
De Gui Li
Keyword(s):  
Ternary Compound ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Structure Refinement ◽  
Structure Type ◽  
Hexagonal Structure ◽  
Powder Diffraction Data ◽  
Tungsten Electrode ◽  
X Ray

Ternary compound Ti4ZrSi3 was prepared by arc melting using a non-consumable tungsten electrode under argon atmosphere, then annealed at 1023K for 30 days, the X-ray powder diffraction data of Ti4ZrSi3 was collected on a Rigaku SmartLab X-ray powder diffractometer. The powder patterns of the compound were indexed and structure refinement by using Rietveld method indicate that the Ti4ZrSi3 compound crystallizes in the hexagonal structure, space group P6/mcm (No.193) with Mn5Si3 structure type, a=b=7.5759(3) Ǻ, c=5.2162(2) Ǻ, V=259.28Ǻ3, Z=2, ρx=4.779g cm-3, the Smith–Snyder FOM F30=148.7(0.0064, 46) and the intensity ratio RIR=1.37. The Rietveld refinement results were Rp = 0.0836, Rwp= 0.1092.

Powder diffraction data of two tricydic diazonia diiodide salts used in silver iodide solid electrolytes

1993 ◽  
Vol 8 (3) ◽  
pp. 175-179
Author(s):  
J. Estienne ◽  
O. Cerclier ◽  
J. J. Rosenberg
Keyword(s):  
Crystal Structure ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Silver Iodide ◽  
Solid Electrolytes ◽  
Rietveld Method ◽  
Powder Diffraction Data ◽  
Organic Salts ◽  
X Ray ◽  
Structure Determinations

Indexed X-ray powder diffraction data are reported for two organic salts with carbon rings having two quaternary nitrogens: diazonia-6,9 dispiro [5.2.5.2] hexadecane and diazonia-6,9 dispiro [5.2.5.3] heptadecane diiodides. For these compounds, which give solid electrolytes when associated with AgI, powder diffraction diagrams calculated by the Rietveld method from single crystal structure determinations are presented and are compared to the experimental diffraction data.

Cristobalite-Related Phases in the NaAlO2–NaAlSiO4 System. II. A Commensurately Modulated Cubic Structure

1998 ◽  
Vol 54 (5) ◽  
pp. 547-557 ◽  
Author(s):  
R. L. Withers ◽  
J. G. Thompson ◽  
A. Melnitchenko ◽  
S. R. Palethorpe
Keyword(s):  
Crystal Structure ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Powder Diffraction Data ◽  
Tetrahedral Framework ◽  
X Ray ◽  
Sodium Aluminosilicate ◽  
Vacancy Ordering ◽  
Cubic Structure

The crystal structure of a new cubic cristobalite-related sodium aluminosilicate Na1.45Al1.45Si0.55O4 [P213, a = 14.553 (1) Å] has been modelled using a modulation wave approach and the model tested against X-ray powder diffraction data using the Rietveld method. Owing to there being 64 independent positional parameters and eight independent Na sites, refinement of the tetrahedral framework atom positions and Na occupancies was not possible. The framework was modelled successfully in terms of q 1 = 1\over 4〈020〉_p^*-type (p = parent) modulation waves with the requirement that the MO4 (M = Al0.725Si0.275) tetrahedra be as close to regular as possible. Na/vacancy ordering was modelled successfully in terms of q 2 = 1\over 4〈220〉_p^* modulation waves. Only the Na-atom positions were refined. The significance of this unique modulated cubic cristobalite-related structure and the possible insight it provides to understanding β-cristobalite are discussed.

X-Ray Powder Diffraction Data and Crystal Refinement of a New Compound AlCrNi3Pr

2016 ◽  
Vol 850 ◽  
pp. 3-7
Author(s):  
Shu Hui Liu ◽  
Liu Qing Liang ◽  
Chang Sheng Qin ◽  
De Gui Li ◽  
Ling Min Zeng ◽  
...  
Keyword(s):  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Structure Refinement ◽  
Structure Type ◽  
Hexagonal Structure ◽  
Powder Diffraction Data ◽  
Tungsten Electrode ◽  
X Ray ◽  
Diffraction Patterns

Rare earth-transition metal (R-T) intermetallics have been well used because of their excellent properties. The X-ray diffraction patterns of many new phases in the R-T system have not been extensively studied. A new compound AlCrNi3Pr was prepared by arc melting using non-consumable tungsten electrode under argon atmosphere, and then annealed at 1023K for 30 days. The X-ray powder diffraction data of AlCrNi3Pr was collected on a Rigaku SmartLab X-ray powder diffractometer. The powder patterns of the compound were indexed, and the structure refinement by using Rietveld method indicated that the AlCrNi3Pr compound crystallized in the hexagonal structure, space group P6/mmm (No.191) with PrNi5 structure type, a=b=5.0553(9) Ǻ, c=4.0763(6) Ǻ, V=90.22Ǻ3, Z=1, ρx=7.288g cm-3, the Smith–Snyder FOM F30=279.1(0.0044, 32) and the intensity ratio RIR=1.23.

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