scholarly journals Single transistor RC‐only second‐order allpass filters

2019 ◽  
Vol 48 (2) ◽  
pp. 162-169 ◽  
Author(s):  
B. J. Maundy ◽  
A. S. Elwakil ◽  
L. Belostotski ◽  
N. Herencsar
Keyword(s):  
Second Order ◽  
Allpass Filters

scholarly journals New Current-Mode Notch and Allpass Filters with Single Current Difference Amplifier

1996 ◽  
Vol 19 (1) ◽  
pp. 25-32 ◽  
Author(s):  
Muhammad Taher Abuelma'atti
Keyword(s):  
Notch Filter ◽  
Current Mode ◽  
Second Order ◽  
Experimental Results ◽  
Allpass Filters ◽  
Current Difference

A new configuration for realization of current-mode notch and allpass filters is presented. It can synthesize second-order notch and allpass filters using a single current difference (Norton) amplifier and at most eight passive RC one port elements. Experimental results obtained from a notch filter realization are presented.

Single-Transistor Second-Order Allpass Filters

2019 ◽  
Author(s):  
M. B. Elamien ◽  
B. J. Maundy ◽  
L. Belostotski ◽  
A. S. Elwakil
Keyword(s):  
Second Order ◽  
Allpass Filters

Disappearance Voltage Determinations Using a Convergent Beam

1971 ◽  
Vol 29 ◽  
pp. 184-185
Author(s):  
W. L. Bell
Keyword(s):  
Second Order ◽  
Objective Method ◽  
Uniform Thickness ◽  
Rocking Curve ◽  
Crystal Perfection ◽  
Kikuchi Line ◽  
Central Maximum ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Beam Technique

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.

Subsystems of Second Order Arithmetic

2009 ◽  
Author(s):  
Stephen G. Simpson
Keyword(s):  
Second Order ◽  
Second Order Arithmetic ◽  
Order Arithmetic

Second order interference in two photon absorption

1996 ◽  
Vol 43 (9) ◽  
pp. 1765-1771 ◽  
Author(s):  
M. W. HAMILTON and D. S. ELLIOTT
Keyword(s):  
Second Order ◽  
Photon Absorption ◽  
Two Photon Absorption ◽  
Two Photon
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