In situ transmission electron microscopy study on Nb-doped Pb(Zr0.95Ti0.05)O3ceramics

Microscopy Research and Technique ◽

10.1002/jemt.20674 ◽

2009 ◽

Vol 72 (3) ◽

pp. 216-222 ◽

Author(s):

Weiguo Qu ◽

Xiaoli Tan ◽

Pin Yang

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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In Situ Scanning Transmission Electron Microscopy Study of MoS2 Formation on Graphene with a Deep-Learning Framework

ACS Omega ◽

10.1021/acsomega.1c03002 ◽

2021 ◽

Author(s):

Yeongdong Lee ◽

Jongyeong Lee ◽

Handolsam Chung ◽

Jaemin Kim ◽

Zonghoon Lee

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Learning Framework ◽

Transmission Electron ◽

Scanning Transmission

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In Situ Transmission Electron Microscopy Study on the Deformation Responses of Additively Manufactured Multiphase Ni-based Superalloy

Microscopy and Microanalysis ◽

10.1017/s1431927620019571 ◽

2020 ◽

Vol 26 (S2) ◽

pp. 1844-1846

Author(s):

Qianying Guo ◽

Michael M. Kirka ◽

Kinga A. Unocic

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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An in-situ and ex-situ transmission electron microscopy study of the substrate orientational dependence of the solid-phase epitaxial growth of amorphized GaAs

1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings ◽

10.1109/commad.1996.610160 ◽

2002 ◽

Author(s):

K.B. Belay ◽

M.C. Ridgway ◽

D.J. Llewellyn

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Epitaxial Growth ◽

Solid Phase ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Ex Situ ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Thermal Stability of Hole-Selective Tungsten Oxide: In Situ Transmission Electron Microscopy Study

Scientific Reports ◽

10.1038/s41598-018-31053-w ◽

2018 ◽

Vol 8 (1) ◽

Author(s):

Haider Ali ◽

Supriya Koul ◽

Geoffrey Gregory ◽

James Bullock ◽

Ali Javey ◽

...

Keyword(s):

Electron Microscopy ◽

Thermal Stability ◽

Transmission Electron Microscopy ◽

Tungsten Oxide ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron ◽

Thermal Stability Of

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In situ transmission electron microscopy study of the formation and migration of vacancy defects in atomically thin black phosphorus

2D Materials ◽

10.1088/2053-1583/abce09 ◽

2020 ◽

Vol 8 (2) ◽

pp. 025004

Author(s):

Fenfa Yao ◽

Yongqing Cai ◽

Zhangru Xiao ◽

Gang Zhang ◽

Rong-Jun Xie ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Black Phosphorus ◽

Transmission Electron Microscopy Study ◽

Vacancy Defects ◽

Transmission Electron ◽

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In situ graphene liquid cell-transmission electron microscopy study of insulin secretion in pancreatic islet cells

International Journal of Nanomedicine ◽

10.2147/ijn.s169506 ◽

2019 ◽

Vol Volume 14 ◽

pp. 371-382 ◽

Author(s):

Emre Firlar ◽

Meagan Ouy ◽

Leigha Covnot ◽

Yuan Xing ◽

Daniel Lee ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Islet Cells ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Pancreatic Islet Cells ◽

Transmission Electron Microscopy Study ◽

Transmission Electron ◽

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In situ transmission electron microscopy study on the crystallization of GeTe binary alloy

Applied Physics Letters ◽

10.1063/1.2919048 ◽

2008 ◽

Vol 92 (19) ◽

pp. 191915 ◽

Author(s):

Eun Tae Kim ◽

Jeong Yong Lee ◽

Yong Tae Kim

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Binary Alloy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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In-Situ Transmission Electron Microscopy Study of Roughness during Silicon Oxidation and Silicidation

10.7567/ssdm.1993.s-iii-1 ◽

1993 ◽

Author(s):

J. M. GIBSON ◽

X. TONG ◽

R. D. TWESTEN ◽

F. M. ROSS

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Silicon Oxidation ◽

Transmission Electron

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Obstacle strength of binary junction due to dislocation dipole formation: An in-situ transmission electron microscopy study

Journal of Nuclear Materials ◽

10.1016/j.jnucmat.2015.06.054 ◽

2015 ◽

Vol 465 ◽

pp. 648-652 ◽

Author(s):

S.M. Hafez Haghighat ◽

R. Schäublin

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Dislocation Dipole ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Note on in situ (scanning) transmission electron microscopy study of liquid samples

Ultramicroscopy ◽

10.1016/j.ultramic.2017.04.012 ◽

2017 ◽

Vol 179 ◽

pp. 81-83 ◽

Author(s):

Nan Jiang

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Liquid Samples ◽

Transmission Electron ◽

Scanning Transmission

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