In situ transmission electron microscopy study of the formation and migration of vacancy defects in atomically thin black phosphorus

2D Materials ◽  
2020 ◽  
Vol 8 (2) ◽  
pp. 025004
Author(s):  
Fenfa Yao ◽  
Yongqing Cai ◽  
Zhangru Xiao ◽  
Gang Zhang ◽  
Rong-Jun Xie ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Black Phosphorus ◽  
Transmission Electron Microscopy Study ◽  
Vacancy Defects ◽  
Transmission Electron ◽  
And Migration
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