scholarly journals Investigation of polarization-dependent loss for a macrobending loss sensitive single-mode fiber

2009 ◽  
Vol 51 (6) ◽  
pp. 1460-1464
Author(s):  
Pengfei Wang ◽  
Gerald Farrell ◽  
Yuliya Semenova ◽  
Ginu Rajan
Keyword(s):  
Single Mode ◽  
Single Mode Fiber ◽  
Polarization Dependent Loss

Laser mode locking using a single-mode-fiber coil with enhanced polarization-dependent loss

2020 ◽  
Vol 45 (10) ◽  
pp. 2866
Author(s):  
Hongbo Jiang ◽  
Yunpeng Huang ◽  
Zihao Zhao ◽  
Takuma Shirahata ◽  
Lei Jin ◽  
...  
Keyword(s):  
Single Mode ◽  
Mode Locking ◽  
Single Mode Fiber ◽  
Laser Mode ◽  
Polarization Dependent Loss ◽  
Fiber Coil

Accurate theoretical prediction for single-mode fiber macrobending loss and bending induced polarization dependent loss

2008 ◽  
Author(s):  
Pengfei Wang ◽  
Gerald Farrell ◽  
Yuliya Semenova ◽  
Qian Wang ◽  
Agus Muhamad Hatta ◽  
...  
Keyword(s):  
Theoretical Prediction ◽  
Single Mode ◽  
Single Mode Fiber ◽  
Induced Polarization ◽  
Polarization Dependent Loss

Research on Coupler of Single Mode Fiber with Photonic Crystal Fiber

2014 ◽  
Vol 596 ◽  
pp. 826-829
Author(s):  
Qing Song Wei ◽  
Zhe Chen ◽  
Yun Han Luo ◽  
Yue Ma ◽  
Xiao Li He ◽  
...  
Keyword(s):  
Photonic Crystal ◽  
Photonic Crystal Fiber ◽  
Reference Method ◽  
Single Mode ◽  
Single Mode Fiber ◽  
Coupling Method ◽  
Coupling Ratio ◽  
Polarization Dependent Loss ◽  
Fiber Coupler ◽  
Crystal Fiber

A coupler of single mode fiber with photonic crystal fiber with a coupling ratio of 0 to 90% was fabricated with a new method called Auto-deposition Fused Side-adhere. A model for coupler of side-polished single mode fiber with side-polished photonic crystal fiber was established which proves it feasible to make such a coupler practically. In the range of 1520~1620nm, the Wavelength Dependent Loss (WDL) of the through port was 0.3dB and of the coupled port was 5dB. The Polarization Dependent Loss of through port was 0.25dB and 0.31dB at 1310nm and 1550nm, and the WDL of coupled port was 1.46dB and 1.75dB. When temperature changed from 10°C to 80°C and humidity changed from 10% to 70%, coupling ratio changed about 7% to 16%. It can be concluded that a steady coupler of single mode fiber with photonic crystal fiber can be made with the Auto-deposition Fused Side-adhere Coupling method, which can give a reference method and lay an experimental foundation for the fabrication of photonic crystal fiber coupler.

The Temperature Dependence of Polarization-Dependent Loss for a Macrobending Single-Mode-Fiber-Based Edge Filter

2009 ◽  
Vol 21 (8) ◽  
pp. 516-518 ◽  
Author(s):  
Pengfei Wang ◽  
Y. Semenova ◽  
G. Rajan ◽  
T. Freir ◽  
G. Farrell
Keyword(s):  
Temperature Dependence ◽  
Single Mode ◽  
Single Mode Fiber ◽  
Polarization Dependent Loss ◽  
Edge Filter

Performance and Reliability of a MEMS-based tunable optical filter operating in the 1565 nm-1525 nm wavelength range

2002 ◽  
Vol 722 ◽  
Author(s):  
T. S. Sriram ◽  
B. Strauss ◽  
S. Pappas ◽  
A. Baliga ◽  
A. Jean ◽  
...  
Keyword(s):  
Silicon Nitride ◽  
Line Width ◽  
Insertion Loss ◽  
Optical Filter ◽  
Single Mode ◽  
Single Mode Fiber ◽  
Reliability Testing ◽  
Silicon Nitride Membrane ◽  
Tunable Optical Filter ◽  
Extensive Performance

AbstractThis paper describes the results of extensive performance and reliability characterization of a silicon-based surface micro-machined tunable optical filter. The device comprises a high-finesse Fabry-Perot etalon with one flat and one curved dielectric mirror. The curved mirror is mounted on an electrostatically actuated silicon nitride membrane tethered to the substrate using silicon nitride posts. A voltage applied to the membrane allows the device to be tuned by adjusting the length of the cavity. The device is coupled optically to an input and an output single mode fiber inside a hermetic package. Extensive performance characterization (over operating temperature range) was performed on the packaged device. Parameters characterized included tuning characteristics, insertion loss, filter line-width and side mode suppression ratio. Reliability testing was performed by subjecting the MEMS structure to a very large number of actuations at an elevated temperature both inside the package and on a test board. The MEMS structure was found to be extremely robust, running trillions of actuations without failures. Package level reliability testing conforming to Telcordia standards indicated that key device parameters including insertion loss, filter line-width and tuning characteristics did not change measurably over the duration of the test.

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