scholarly journals Characterization of polymeric surfaces and interfaces using time‐of‐flight secondary ion mass spectrometry

2021 ◽  
Author(s):  
Hao Mei ◽  
Travis S. Laws ◽  
Tanguy Terlier ◽  
Rafael Verduzco ◽  
Gila E. Stein
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Polymeric Surfaces ◽  
Surfaces And Interfaces ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Detection of Au+ Ions During Fluorine Gas-Assisted Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for the Complete Elemental Characterization of Microbatteries

2021 ◽  
Vol 13 (34) ◽  
pp. 41262-41274
Author(s):  
Agnieszka Priebe ◽  
Jordi Sastre ◽  
Moritz H. Futscher ◽  
Jakub Jurczyk ◽  
Marcos V. Puydinger dos Santos ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Elemental Characterization

Characterization of sequentially grafted polysaccharide coatings using time-of-flight secondary ion mass spectrometry (ToF-SIMS) and principal component analysis (PCA)

2002 ◽  
Vol 33 (12) ◽  
pp. 924-931 ◽  
Author(s):  
Sally L. McArthur ◽  
Matthew S. Wagner ◽  
Patrick G. Hartley ◽  
Keith M. McLean ◽  
Hans J. Griesser ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Principal Component Analysis ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Principal Component ◽  
Component Analysis ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Characterization of gunpowder samples using time-of-flight secondary ion mass spectrometry (TOF-SIMS)

2006 ◽  
Vol 158 (1) ◽  
pp. 39-51 ◽  
Author(s):  
Christine M. Mahoney ◽  
Greg Gillen ◽  
Albert J. Fahey
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Quantitative time-of-flight secondary ion mass spectrometry for the characterization of multicomponent adsorbed protein films

2003 ◽  
Vol 203-204 ◽  
pp. 704-709 ◽  
Author(s):  
M.S. Wagner ◽  
M. Shen ◽  
T.A. Horbett ◽  
David G. Castner
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Protein Films ◽  
Adsorbed Protein ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Static time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy characterization of adsorbed albumin and fibronectin films

2001 ◽  
Vol 31 (8) ◽  
pp. 724-733 ◽  
Author(s):  
Caren D. Tidwell ◽  
David G. Castner ◽  
Stephen L. Golledge ◽  
Buddy D. Ratner ◽  
Klaus Meyer ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
X Ray ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) for high-throughput characterization of biosurfaces

2003 ◽  
Vol 203-204 ◽  
pp. 855-858 ◽  
Author(s):  
S. Roberson ◽  
A. Sehgal ◽  
A. Fahey ◽  
A. Karim
Keyword(s):  
Mass Spectrometry ◽  
High Throughput ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
Secondary Ion
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