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Characterization of polymeric surfaces and interfaces using time‐of‐flight secondary ion mass spectrometry
Journal of Polymer Science
◽
10.1002/pol.20210282
◽
2021
◽
Author(s):
Hao Mei
◽
Travis S. Laws
◽
Tanguy Terlier
◽
Rafael Verduzco
◽
Gila E. Stein
Keyword(s):
Mass Spectrometry
◽
Secondary Ion Mass Spectrometry
◽
Time Of Flight
◽
Polymeric Surfaces
◽
Surfaces And Interfaces
◽
Ion Mass Spectrometry
◽
Secondary Ion
Download Full-text
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Forensic Characterization of Lipsticks Using Time-of-Flight Secondary Ion Mass Spectrometry
Journal of Analytical Chemistry
◽
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Characterization of sequentially grafted polysaccharide coatings using time-of-flight secondary ion mass spectrometry (ToF-SIMS) and principal component analysis (PCA)
Surface and Interface Analysis
◽
10.1002/sia.1446
◽
2002
◽
Vol 33
(12)
◽
pp. 924-931
◽
Cited By ~ 13
Author(s):
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Matthew S. Wagner
◽
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Keith M. McLean
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Hans J. Griesser
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...
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Interfacial Characterization of Dentin Conditioned with Chitosan Hydroxyapatite Precursor Nanocomplexes Using Time-of-flight Secondary Ion Mass Spectrometry
Journal of Endodontics
◽
10.1016/j.joen.2019.08.011
◽
2019
◽
Vol 45
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pp. 1513-1521
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Characterization of gunpowder samples using time-of-flight secondary ion mass spectrometry (TOF-SIMS)
Forensic Science International
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10.1016/j.forsciint.2005.02.036
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2006
◽
Vol 158
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◽
pp. 39-51
◽
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Author(s):
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◽
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◽
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◽
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◽
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◽
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Static time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy characterization of adsorbed albumin and fibronectin films
Surface and Interface Analysis
◽
10.1002/sia.1101
◽
2001
◽
Vol 31
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◽
pp. 724-733
◽
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◽
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◽
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◽
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◽
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◽
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◽
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Characterization of a Lubricant Film in a Wearing Region on a Thin-Film Magnetic Recording Disk by Time-of-Flight Secondary Ion Mass Spectrometry.
Journal of the Magnetics Society of Japan
◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
Time Of Flight
◽
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THE APPLICATION OF TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY (ToF-SIMS) TO THE CHARACTERIZATION OF OPAQUE ANCIENT GLASSES
Archaeometry
◽
10.1111/j.1475-4754.2009.00445.x
◽
2009
◽
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◽
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Time-of-flight secondary ion mass spectrometry (TOF-SIMS) for high-throughput characterization of biosurfaces
Applied Surface Science
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10.1016/s0169-4332(02)00822-x
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2003
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Vol 203-204
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pp. 855-858
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Cited By ~ 12
Author(s):
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◽
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◽
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A. Karim
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Secondary Ion Mass Spectrometry
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Time Of Flight
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Secondary Ion
Download Full-text
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