X‐ray diffraction characterization of microdefects in silicon crystals after high‐energy electron irradiation

2011 ◽  
Vol 208 (11) ◽  
pp. 2552-2557 ◽  
Author(s):  
V. B. Molodkin ◽  
S. I. Olikhovskii ◽  
E. G. Len ◽  
B. V. Sheludchenko ◽  
S. V. Lizunova ◽  
...  
Keyword(s):  
Electron Irradiation ◽  
High Energy ◽  
Energy Electron ◽  
High Energy Electron ◽  
X Ray Diffraction ◽  
X Ray ◽  
Silicon Crystals

Influence of high energy electron irradiation on the network structure of gelatin hydrogels as investigated by small-angle X-ray scattering (SAXS)

2017 ◽  
Vol 19 (19) ◽  
pp. 12064-12074 ◽  
Author(s):  
Emilia I. Wisotzki ◽  
Paolo Tempesti ◽  
Emiliano Fratini ◽  
Stefan G. Mayr
Keyword(s):  
Electron Irradiation ◽  
Network Structure ◽  
Small Angle ◽  
High Energy ◽  
Energy Electron ◽  
High Energy Electron ◽  
X Ray ◽  
X Ray Scattering ◽  
Structural Differences ◽  
Ray Scattering

Small-angle X-ray scattering revealed ranging structural differences in physically entangled and irradiation-crosslinked gelatin hydrogels.

Relaxor Properties and Tunability of Electron-Irradiated Thin Poly(vinlidene fluoride-trifluoroethylene) Copolymer Film

2012 ◽  
Vol 560-561 ◽  
pp. 892-898 ◽  
Author(s):  
Li Tian ◽  
Xiang Jian Meng ◽  
Jing Yang ◽  
Jing Lan Sun ◽  
Sheng Zhao Yuan ◽  
...  
Keyword(s):  
Electron Irradiation ◽  
Dielectric Spectroscopy ◽  
High Energy ◽  
Copolymer Film ◽  
Relaxor Behavior ◽  
High Energy Electron ◽  
X Ray Diffraction ◽  
Gauche Conformation ◽  
Trans Conformation ◽  
X Ray

The effect of high energy electron irradiation on poly(vinlidene fluoride-trifluoroethylene) copolymer film with thickness about 180 nm has been studied. Both dielectric spectroscopy investigation and X-Ray Diffraction show that all-trans conformation of pre-irradiated films is transformed to trans-gauche conformation after irradiation. The relaxor behavior of irradiated sample obeys the modified Curie-Weiss and Vogel-Fulcher law. And the tunability is increased from 42% to 63% after irradiation.

Fe3O4/MgO Superlattices Grown on MgO(OOl) and Fe/MgO(001) by Molecular Beam Epitaxy

1997 ◽  
Vol 474 ◽  
Author(s):  
G. Chern ◽  
C. L. Chang ◽  
Y. R. Chean
Keyword(s):  
Molecular Beam ◽  
Lattice Mismatch ◽  
High Energy ◽  
High Energy Electron ◽  
X Ray Diffraction ◽  
Oxide Interface ◽  
High Crystalline Quality ◽  
X Ray ◽  
Coated Surface

AbstractThe growth and structural characterization of Fe3O4/MgO superlattices on MgO(001) and Fe-coated MgO(001) are compared. Long modulated coherence and sharp interface are revealed by X-ray diffraction and reflection high energy electron diffraction (RHEED). For the superlattice grown directly on MgO(001), high crystalline quality is comparable to the previous report on the oxide superlattice system. For the superlattice grown on Fe/MgO(001), both chemical and lattice spacing modulations are maintained which is different from the polycrystlline structure of the Fe3O4/NiO grown on Ni-based system. This superiority of the growth on Fe-coated surface results from both the smaller lattice mismatch and the oxidation state of Fe relative to MgO. The changes of the RHEED intensity during the growth of these superlattices are also measured. The evolution of the oxide interface during the growth of Fe3O4/MgO is quantitatively presented.

Electrical and Optical Characterization of n-GaN by High Energy Electron Irradiation

2012 ◽  
Vol 29 (9) ◽  
pp. 097801
Author(s):  
Li-Min Liang ◽  
Xin-Jian Xie ◽  
Qiu-Yan Hao ◽  
Yuan Tian ◽  
Cai-Chi Liu
Keyword(s):  
Electron Irradiation ◽  
Optical Characterization ◽  
High Energy ◽  
Energy Electron ◽  
High Energy Electron

Structural changes of silicon crystals after high-energy electron irradiation

2004 ◽  
Author(s):  
A. G. Gimchinsky ◽  
B. I. Gutsulyak ◽  
A. V. Oleynich-Lysyuk ◽  
N. D. Raransky ◽  
Z. Swiantek
Keyword(s):  
Electron Irradiation ◽  
Structural Changes ◽  
High Energy ◽  
Energy Electron ◽  
High Energy Electron ◽  
Silicon Crystals

scholarly journals Comparison of azimuthal plots for reflection high-energy positron diffraction (RHEPD) and reflection high-energy electron diffraction (RHEED) for Si(111) surface

2020 ◽  
Vol 76 (3) ◽  
pp. 328-333
Author(s):  
Zbigniew Mitura
Keyword(s):  
Electron Diffraction ◽  
Diffraction Theory ◽  
High Energy ◽  
Energy Electron ◽  
Formation Mechanisms ◽  
High Energy Electron ◽  
X Ray Diffraction ◽  
X Ray ◽  
Scattering Effects ◽  
Multiple Scattering Effects

Azimuthal plots for RHEPD (reflection high-energy positron diffraction) and RHEED (reflection high-energy electron diffraction) were calculated using dynamical diffraction theory and then compared. It was assumed that RHEPD and RHEED azimuthal plots can be collected practically by recording the intensity while rotating the sample around the axis perpendicular to the surface (for the case of X-ray diffraction, such forms of data are called Renninger scans). It was found that RHEPD plots were similar to RHEED plots if they were compared at Bragg reflections of the same order. RHEPD plots can also be determined in the region of total external reflection and for such conditions multiple scattering effects turned out to be very weak. The findings for azimuthal plots are also discussed in the context of the formation mechanisms of Kikuchi patterns.

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