Determination of quasi-Fermi level at the metal–semiconductor interface in a forward-biased schottky barrier diode
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1981 ◽
Vol 24
(10)
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pp. 889-895
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Keyword(s):
2001 ◽
Vol 80
(1-3)
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pp. 142-146
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2009 ◽
Vol 53
(2)
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pp. 234-240
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1984 ◽
Vol 31
(12)
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pp. 1976-1977
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