Focus Dependence of the Black-White Contrast of Small Point Defect Clusters on Transmission Electron Microscope Images of Crystalline Specimens

phys stat sol (a) ◽

10.1002/pssa.2210890207 ◽

1985 ◽

Vol 89 (2) ◽

pp. 467-482 ◽

Author(s):

W. Gruschel ◽

M. Wilkens

Keyword(s):

Electron Microscope ◽

Point Defect ◽

Transmission Electron Microscope ◽

Defect Clusters ◽

Transmission Electron ◽

Microscope Images ◽

Point Defect Clusters ◽

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Transmission electron microscope studies of point defect clusters in fcc and bcc metals

Journal of Physics F Metal Physics ◽

10.1088/0305-4608/3/2/009 ◽

1973 ◽

Vol 3 (2) ◽

pp. 422-470 ◽

Author(s):

B L Eyre

Keyword(s):

Electron Microscope ◽

Point Defect ◽

Transmission Electron Microscope ◽

Defect Clusters ◽

Transmission Electron ◽

Point Defect Clusters

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Transmission Electron Microscope Studies of Defect Clusters in Aluminium Irradiated with Gold Ions

Applications of Ion Beams to Metals ◽

10.1007/978-1-4684-2079-1_37 ◽

1974 ◽

pp. 469-480 ◽

Author(s):

C. Gómez-Giráldez ◽

B. Hertel ◽

M. Rühle ◽

M. Wilkens

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Defect Clusters ◽

Transmission Electron

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Comparison of Transmission Electron Microscope Cross Sections of Amorphous Regions in Ion Implanted Silicon with Point‐Defect Density Calculations

Journal of The Electrochemical Society ◽

10.1149/1.2069134 ◽

1992 ◽

Vol 139 (12) ◽

pp. 3631-3638 ◽

Author(s):

H. Cerva ◽

G. Hobler

Keyword(s):

Electron Microscope ◽

Point Defect ◽

Transmission Electron Microscope ◽

Cross Sections ◽

Defect Density ◽

Transmission Electron ◽

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On the application of the weak-beam technique to the determination of the sizes of small point-defect clusters in ion-irradiated copper

Journal of Electron Microscopy ◽

10.1093/oxfordjournals.jmicro.a023684 ◽

1999 ◽

Vol 48 (4) ◽

pp. 323-332 ◽

Author(s):

M. L. Jenkins ◽

M. A. Kirk ◽

H. Fukushima

Keyword(s):

Point Defect ◽

Defect Clusters ◽

Weak Beam ◽

Point Defect Clusters ◽

Beam Technique ◽

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Impact of dynamical scattering on quantitative contrast for aberration-corrected transmission electron microscope images

Micron ◽

10.1016/j.micron.2016.07.008 ◽

2016 ◽

Vol 89 ◽

pp. 77-86 ◽

Author(s):

C. Wen ◽

David J. Smith

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Transmission Electron ◽

Microscope Images ◽

Aberration Corrected

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Transmission Electron Microscopy of Point-Defect Clusters in Neutron-Irradiated Metals. I. Copper

physica status solidi (b) ◽

10.1002/pssb.19700390228 ◽

1970 ◽

Vol 39 (2) ◽

pp. 609-620 ◽

Author(s):

M. Rühle ◽

F. Häussermann ◽

M. Rapp

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Point Defect ◽

Defect Clusters ◽

Transmission Electron ◽

Point Defect Clusters

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Computer simulation of high‐resolution transmission electron microscope images based on ball‐and‐spoke models of (100) Si/SiO2interface

Journal of Applied Physics ◽

10.1063/1.337563 ◽

1986 ◽

Vol 60 (11) ◽

pp. 3900-3904 ◽

Author(s):

Iwao Ohdomari ◽

Tohru Mihara ◽

Kazuhiko Kai

Keyword(s):

Computer Simulation ◽

Electron Microscope ◽

High Resolution ◽

Transmission Electron Microscope ◽

Transmission Electron ◽

Microscope Images

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Image analysis in transmission electron microscope images of amorphous carbon film

Electronics and Communications in Japan (Part II Electronics) ◽

10.1002/(sici)1520-6432(199807)81:7<64::aid-ecjb8>3.0.co;2-2 ◽

1998 ◽

Vol 81 (7) ◽

pp. 64-70

Author(s):

Kyoichi Oshida ◽

Minoru Kobayashi ◽

Terumi Furuta ◽

Morinobu Endo ◽

Agnes Oberlin

Keyword(s):

Image Analysis ◽

Electron Microscope ◽

Amorphous Carbon ◽

Transmission Electron Microscope ◽

Carbon Film ◽

Amorphous Carbon Film ◽

Transmission Electron ◽

Microscope Images

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Restoring defect structures in 3C-SiC/Si (001) from spherical aberration-corrected high-resolution transmission electron microscope images by means of deconvolution processing

Micron ◽

10.1016/j.micron.2014.12.008 ◽

2015 ◽

Vol 71 ◽

pp. 22-31 ◽

Author(s):

C. Wen ◽

W. Wan ◽

F.H. Li ◽

D. Tang

Keyword(s):

Electron Microscope ◽

High Resolution ◽

Transmission Electron Microscope ◽

Spherical Aberration ◽

Defect Structures ◽

Transmission Electron ◽

Microscope Images ◽

Aberration Corrected

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Interpretation of transmission electron microscope images of amorphous silicon/germanium and silicon/iron multilayers

Journal of Applied Physics ◽

10.1063/1.347275 ◽

1991 ◽

Vol 69 (3) ◽

pp. 1371-1376 ◽

Author(s):

P. Donovan ◽

B. George ◽

A. Bruson ◽

C. Dufour ◽

G. Marchal ◽

...

Keyword(s):

Electron Microscope ◽

Amorphous Silicon ◽

Transmission Electron Microscope ◽

Silicon Germanium ◽

Silicon Iron ◽

Transmission Electron ◽

Microscope Images ◽

Amorphous Silicon Germanium

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