Process Yield Analysis for Nonlinear Profiles in the Presence of Gauge Measurement Errors

Quality and Reliability Engineering International ◽

10.1002/qre.1946 ◽

2015 ◽

Vol 32 (7) ◽

pp. 2435-2442 ◽

Author(s):

Fu-Kwun Wang

Keyword(s):

Measurement Errors ◽

Process Yield ◽

Yield Analysis ◽

Gauge Measurement

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Process Yield Analysis for Linear Within-Profile Autocorrelation

Quality and Reliability Engineering International ◽

10.1002/qre.1663 ◽

2014 ◽

Vol 31 (6) ◽

pp. 1053-1061 ◽

Author(s):

Fu-Kwun Wang ◽

Yeneneh Tamirat

Keyword(s):

Process Yield ◽

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Identifying and Correcting Rain Gauge Measurement Errors Using a Highly Accurate Hydrologic Model and Radar Reflectivity Data

Proceedings of the Water Environment Federation ◽

10.2175/193864710798216350 ◽

2010 ◽

Vol 2010 (6) ◽

pp. 185-192

Author(s):

Tim Kuhns ◽

Robert Czachorski ◽

Scott Martin

Keyword(s):

Measurement Errors ◽

Hydrologic Model ◽

Radar Reflectivity ◽

Reflectivity Data ◽

Gauge Measurement

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Process yield analysis for multivariate linear profiles

Quality Technology & Quantitative Management ◽

10.1080/16843703.2016.1169676 ◽

2016 ◽

Vol 13 (2) ◽

pp. 124-138 ◽

Author(s):

Fu-Kwun Wang

Keyword(s):

Process Yield ◽

Yield Analysis ◽

Linear Profiles

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Performance evaluation of processes with asymmetric tolerances in the presence of gauge measurement errors

Communication in Statistics- Theory and Methods ◽

10.1080/03610926.2014.894068 ◽

2016 ◽

Vol 45 (10) ◽

pp. 3011-3026 ◽

Author(s):

Dwi Yuli Rakhmawati ◽

Chien-Wei Wu ◽

Chao-Lung Yang

Keyword(s):

Performance Evaluation ◽

Measurement Errors ◽

Asymmetric Tolerances ◽

Gauge Measurement

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Lower confidence bound for capability indices with asymmetric tolerances and gauge measurement errors

International Journal of Quality Engineering and Technology ◽

10.1504/ijqet.2011.041228 ◽

2011 ◽

Vol 2 (3) ◽

pp. 212 ◽

Author(s):

Daniel Grau

Keyword(s):

Measurement Errors ◽

Confidence Bound ◽

Lower Confidence ◽

Lower Confidence Bound ◽

Capability Indices ◽

Asymmetric Tolerances ◽

Gauge Measurement

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Generalized Inference for Measuring Process Yield With the Contamination of Measurement Errors—Quality Control for Silicon Wafer Manufacturing Processes in the Semiconductor Industry

IEEE Transactions on Semiconductor Manufacturing ◽

10.1109/tsm.2011.2181433 ◽

2012 ◽

Vol 25 (2) ◽

pp. 272-283 ◽

Author(s):

Chien-Wei Wu ◽

Mou-Yuan Liao

Keyword(s):

Quality Control ◽

Silicon Wafer ◽

Measurement Errors ◽

Semiconductor Industry ◽

Manufacturing Processes ◽

Measuring Process ◽

Process Yield ◽

Generalized Inference ◽

Wafer Manufacturing

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A product acceptance decision-making method based on process capability with considering gauge measurement errors

Communication in Statistics- Theory and Methods ◽

10.1080/03610926.2021.1955929 ◽

2021 ◽

pp. 1-20

Author(s):

Dwi Yuli Rakhmawati ◽

Junghye Lee

Keyword(s):

Decision Making ◽

Measurement Errors ◽

Process Capability ◽

Gauge Measurement

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Properties of multivariate process capability in the presence of gauge measurement errors and dependency measure of process variables

Journal of Manufacturing Systems ◽

10.1016/j.jmsy.2010.06.005 ◽

2010 ◽

Vol 29 (1) ◽

pp. 10-18 ◽

Author(s):

Davood Shishebori ◽

Ali Zeinal Hamadani

Keyword(s):

Measurement Errors ◽

Process Capability ◽

Process Variables ◽

Multivariate Process ◽

Gauge Measurement

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Process Yield With Measurement Errors in Semiconductor Manufacturing

IEEE Transactions on Semiconductor Manufacturing ◽

10.1109/tsm.2008.2000270 ◽

2008 ◽

Vol 21 (2) ◽

pp. 279-284 ◽

Author(s):

Fu-Kwun Wang

Keyword(s):

Measurement Errors ◽

Semiconductor Manufacturing ◽

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Gauge measurement errors and multivariate capability indices

2010 International Conference on Networking and Information Technology ◽

10.1109/icnit.2010.5508447 ◽

2010 ◽

Author(s):

Davood Shishebori ◽

Ali Zeinal Hamadani

Keyword(s):

Measurement Errors ◽

Capability Indices ◽

Gauge Measurement

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