Reliability inference for VGA adapter from dual suppliers based on contaminated type‐I interval‐censored data
2010 ◽
Vol 39
(4)
◽
pp. 750-766
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Planning life tests with progressively Type-I interval censored data from the lognormal distribution
2009 ◽
Vol 139
(1)
◽
pp. 54-61
◽
Keyword(s):
Type I
◽
Keyword(s):