P‐1.8: A 3‐Probe Approach to Study Dynamic Operation in High Voltage Thin Film Transistors
2015 ◽
Vol 62
(12)
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pp. 4213-4219
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1989 ◽
Vol 115
(1-3)
◽
pp. 141-143
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Keyword(s):
Keyword(s):
Keyword(s):
1993 ◽
Vol 40
(3)
◽
pp. 634-644
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Keyword(s):