SIMS depth profiling analysis of P-doped n-type Si layer to develop the Si QD solar cell

2014 ◽  
Vol 46 (S1) ◽  
pp. 341-343
Author(s):  
Tae Woon Kim ◽  
Hyun Jeong Baek ◽  
Jong Shik Jang ◽  
Seung Mi Lee ◽  
Kyung Joong Kim
Keyword(s):  
Solar Cell ◽  
Depth Profiling ◽  
Profiling Analysis ◽  
Sims Depth Profiling

SIMS depth profiling analysis of halogens in CdTe/CdS/TSO solar cells using Cs2M+ cluster ions

2008 ◽  
Vol 255 (4) ◽  
pp. 1423-1426 ◽  
Author(s):  
O. Koudriavtseva ◽  
A. Morales-Acevedo ◽  
Yu. Kudriavtsev ◽  
S. Gallardo ◽  
R. Asomoza ◽  
...  
Keyword(s):  
Solar Cells ◽  
Depth Profiling ◽  
Cluster Ions ◽  
Profiling Analysis ◽  
Sims Depth Profiling

Characterization of polymeric light emitting diodes by SIMS depth profiling analysis

1995 ◽  
Vol 353 (5-8) ◽  
pp. 642-646 ◽  
Author(s):  
G. Sauer ◽  
M. Kilo ◽  
M. Hund ◽  
A. Wokaun ◽  
S. Karg ◽  
...  
Keyword(s):  
Light Emitting Diodes ◽  
Depth Profiling ◽  
Light Emitting ◽  
Profiling Analysis ◽  
Sims Depth Profiling

ToF-SIMS depth profiling of organic solar cell layers using an Ar cluster ion source

2013 ◽  
Vol 31 (3) ◽  
pp. 030601 ◽  
Author(s):  
Vincent S. Smentkowski ◽  
Gilad Zorn ◽  
Amanda Misner ◽  
Gautam Parthasarathy ◽  
Aaron Couture ◽  
...  
Keyword(s):  
Solar Cell ◽  
Organic Solar Cell ◽  
Depth Profiling ◽  
Ion Source ◽  
Tof Sims ◽  
Cluster Ion Source ◽  
Cell Layers ◽  
Cluster Ion ◽  
Sims Depth Profiling

SIMS depth profiling analysis of electrical arc residues in fire investigation

2003 ◽  
Vol 203-204 ◽  
pp. 779-784 ◽  
Author(s):  
C.Y. Chen ◽  
Y.C. Ling ◽  
J.T. Wang ◽  
H.Y. Chen
Keyword(s):  
Depth Profiling ◽  
Fire Investigation ◽  
Electrical Arc ◽  
In Fire ◽  
Profiling Analysis ◽  
Sims Depth Profiling

Spatial determination of gold catalyst residue used in the production of ZnO nanowires by SIMS depth profiling analysis

2007 ◽  
Vol 39 (11) ◽  
pp. 898-901 ◽  
Author(s):  
R. J. H. Morris ◽  
M. G. Dowsett ◽  
S. H. Dalal ◽  
D. L. Baptista ◽  
K. B. K. Teo ◽  
...  
Keyword(s):  
Gold Catalyst ◽  
Depth Profiling ◽  
Zno Nanowires ◽  
Profiling Analysis ◽  
Sims Depth Profiling

The effect of orientation on ion beam erosion rates in ionic crystals measured by SIMS depth profiling

1991 ◽  
Vol 17 (3) ◽  
pp. 158-164 ◽  
Author(s):  
A. M. C. Kilner ◽  
J. A. Kilner ◽  
J. C. Elliott ◽  
G. Cressey ◽  
S. D. Littlewood
Keyword(s):  
Ion Beam ◽  
Depth Profiling ◽  
Ionic Crystals ◽  
Erosion Rates ◽  
Sims Depth Profiling
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