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An effect of residual gas component on detected secondary ions during TOF-SIMS depth profiling and a method to estimate contained component
Surface and Interface Analysis
◽
10.1002/sia.6479
◽
2018
◽
Vol 50
(8)
◽
pp. 802-806
◽
Cited By ~ 2
Author(s):
Junichiro Sameshima
◽
Masanobu Yoshikawa
Keyword(s):
Depth Profiling
◽
Tof Sims
◽
Secondary Ions
◽
Residual Gas
◽
Gas Component
◽
Sims Depth Profiling
Download Full-text
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References
TOF-SIMS depth profiling of SIMON
Applied Surface Science
◽
10.1016/s0169-4332(02)00697-9
◽
2003
◽
Vol 203-204
◽
pp. 441-444
Author(s):
Ge Xin
◽
Gui Dong
◽
Chen Xu
◽
Cha Liangzhen
◽
O. Brox
◽
...
Keyword(s):
Depth Profiling
◽
Tof Sims
◽
Sims Depth Profiling
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ToF-SIMS depth profiling of vitamin C layers using Cs+ and Xe+ ion beams
Surface and Interface Analysis
◽
10.1002/sia.3426
◽
2010
◽
Vol 43
(1-2)
◽
pp. 190-193
◽
Cited By ~ 3
Author(s):
Nimer Wehbe
◽
Laurent Houssiau
Keyword(s):
Vitamin C
◽
Depth Profiling
◽
Ion Beams
◽
Tof Sims
◽
Sims Depth Profiling
Download Full-text
TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings
Analytical and Bioanalytical Chemistry
◽
10.1007/s00216-008-2525-7
◽
2008
◽
Vol 393
(8)
◽
pp. 1857-1861
◽
Cited By ~ 7
Author(s):
J. Schnöller
◽
R. Franz
◽
C. Mitterer
◽
H. Hutter
Keyword(s):
Depth Profiling
◽
Hard Coatings
◽
Tof Sims
◽
Sims Depth Profiling
◽
Element Mapping
Download Full-text
Argon Cluster Sputtering Source for ToF-SIMS Depth Profiling of Insulating Materials: High Sputter Rate and Accurate Interfacial Information
Journal of the American Society for Mass Spectrometry
◽
10.1007/s13361-015-1159-1
◽
2015
◽
Vol 26
(8)
◽
pp. 1283-1290
◽
Cited By ~ 12
Author(s):
Zhaoying Wang
◽
Bingwen Liu
◽
Evan W. Zhao
◽
Ke Jin
◽
Yingge Du
◽
...
Keyword(s):
Depth Profiling
◽
Insulating Materials
◽
Tof Sims
◽
Sims Depth Profiling
Download Full-text
ToF-SIMS Depth Profiling of Cells:z-Correction, 3D Imaging, and Sputter Rate of Individual NIH/3T3 Fibroblasts
Analytical Chemistry
◽
10.1021/ac300480g
◽
2012
◽
Vol 84
(11)
◽
pp. 4880-4885
◽
Cited By ~ 80
Author(s):
Michael A. Robinson
◽
Daniel J. Graham
◽
David G. Castner
Keyword(s):
3D Imaging
◽
Depth Profiling
◽
3T3 Fibroblasts
◽
Tof Sims
◽
Nih 3T3
◽
Sims Depth Profiling
Download Full-text
ToF-SIMS depth profiling of alumina scales formed on a FeCrAl high-temperature alloy
Applied Surface Science
◽
10.1016/j.apsusc.2004.03.141
◽
2004
◽
Vol 231-232
◽
pp. 850-853
◽
Cited By ~ 9
Author(s):
J. Engkvist
◽
U. Bexell
◽
T.M. Grehk
◽
M. Olsson
Keyword(s):
High Temperature
◽
Depth Profiling
◽
Alumina Scales
◽
High Temperature Alloy
◽
Tof Sims
◽
Sims Depth Profiling
Download Full-text
TOF-SIMS depth profiling study of corrosion propagation in coated hollow spheres
Surface and Interface Analysis
◽
10.1002/sia.2207
◽
2006
◽
Vol 38
(4)
◽
pp. 833-837
◽
Cited By ~ 3
Author(s):
Renáta Oriňáková
◽
Andrej Oriňák
◽
Heinrich F. Arlinghaus
◽
Sebastian Hellweg
◽
Miriam Kupková
◽
...
Keyword(s):
Hollow Spheres
◽
Depth Profiling
◽
Corrosion Propagation
◽
Tof Sims
◽
Sims Depth Profiling
Download Full-text
Determination of Secondary-Ions Yield in SIMS Depth Profiling of Si, Mg, and C Ions Implanted Gan Epitaxial Layers
2018 12th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)
◽
10.1109/asdam.2018.8544657
◽
2018
◽
Cited By ~ 1
Author(s):
M. Tapajna
◽
A. Vincze
◽
P. Noga
◽
J. Dobrovodsky
◽
A. Svagatova
◽
...
Keyword(s):
Depth Profiling
◽
Epitaxial Layers
◽
Secondary Ions
◽
Sims Depth Profiling
Download Full-text
SIMS depth profiling of Pd/B4C, Ni/C, and Cr/Sc multilayer metal structures using registration of cluster secondary ions: The problem of depth resolution enhancement
Bulletin of the Russian Academy of Sciences Physics
◽
10.3103/s1062873811010096
◽
2011
◽
Vol 75
(1)
◽
pp. 100-104
◽
Cited By ~ 2
Author(s):
M. N. Drozdov
◽
Yu. N. Drozdov
◽
M. M. Barysheva
◽
V. N. Polkovnikov
◽
N. I. Chkhalo
Keyword(s):
Resolution Enhancement
◽
Depth Profiling
◽
Depth Resolution
◽
Metal Structures
◽
Secondary Ions
◽
Sims Depth Profiling
◽
Multilayer Metal
Download Full-text
Investigating the chain conformations of spin-coated polymer thin films by ToF-SIMS depth profiling
Surface and Interface Analysis
◽
10.1002/sia.5801
◽
2015
◽
Vol 47
(10)
◽
pp. 953-960
◽
Cited By ~ 2
Author(s):
Xianwen Ren
◽
Lu-Tao Weng
◽
Yi Fu
◽
Kai-Mo Ng
◽
Chi-Ming Chan
Keyword(s):
Thin Films
◽
Polymer Thin Films
◽
Depth Profiling
◽
Tof Sims
◽
Chain Conformations
◽
Sims Depth Profiling
Download Full-text
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