Chemical and structural characterization of epitaxial compound semiconductor layers using X-ray photoelectron diffraction
1981 ◽
Vol 3
(6)
◽
pp. 269-271
◽
Keyword(s):
X Ray
◽
1991 ◽
Vol 9
(3)
◽
pp. 1861
◽
2001 ◽
Vol 482-485
◽
pp. 1474-1480
◽
1988 ◽
Vol 6
(3)
◽
pp. 1946-1949
◽
Keyword(s):
2005 ◽
Vol 66
(1)
◽
pp. 81-90
◽
2012 ◽
Vol 16
(01)
◽
pp. 154-162
◽
1980 ◽
Vol 102
(25)
◽
pp. 7564-7565
◽