The Scanning–Tunneling Microscopy, the X-Ray Photoelectron Spectroscopy, the Inner-Shell-Electron Energy-Loss Spectroscopy Studies ofMTe2andM3SiTe6(M=Nb and Ta)

1999 ◽  
Vol 142 (1) ◽  
pp. 63-73 ◽  
Author(s):  
Youichi Ohno
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