Characterization of the Nickel Cobaltite, NiCo2O4, Prepared by Several Methods: An XRD, XANES, EXAFS, and XPS Study

2000 ◽  
Vol 153 (1) ◽  
pp. 74-81 ◽  
Author(s):  
J.F. Marco ◽  
J.R. Gancedo ◽  
M. Gracia ◽  
J.L. Gautier ◽  
E. Ríos ◽  
...  
Keyword(s):  
Nickel Cobaltite ◽  
Xps Study

Characterization of the surface of Fe–19Mn–18Cr–C–N during heat treatment in a high vacuum — An XPS study

2012 ◽  
Vol 71 ◽  
pp. 66-76 ◽  
Author(s):  
K. Zumsande ◽  
A. Weddeling ◽  
E. Hryha ◽  
S. Huth ◽  
L. Nyborg ◽  
...  
Keyword(s):  
Heat Treatment ◽  
High Vacuum ◽  
Xps Study

scholarly journals The characterization of the interfacial interaction between polymeric methylene diphenyl diisocyanate and aluminum: a ToF-SIMS and XPS study

2010 ◽  
Vol 42 (8) ◽  
pp. 1432-1444 ◽  
Author(s):  
Kyoko Shimizu ◽  
Christopher Phanopoulos ◽  
Raf Loenders ◽  
Marie-Laure Abel ◽  
John F. Watts
Keyword(s):  
Interfacial Interaction ◽  
Tof Sims ◽  
Methylene Diphenyl Diisocyanate ◽  
Xps Study

XPS Study of a New Heterogeneous Ruthenium Catalyst Precursor

1997 ◽  
Vol 51 (12) ◽  
pp. 1807-1813 ◽  
Author(s):  
P. Smet ◽  
F. Verpoort ◽  
G. De Doncker ◽  
A. R. Bossuyt ◽  
L. Fiermans ◽  
...  
Keyword(s):  
Thin Layer ◽  
Photoelectron Spectroscopy ◽  
Surface Reaction ◽  
Silica Surface ◽  
Silicon Single Crystal ◽  
Catalyst Precursor ◽  
X Ray ◽  
Different Types ◽  
Xps Study

The catalyst precursor has been synthesized by modifying the silica surface with ClPPh2 followed by a surface reaction with RuCl3. Supports consisting of a thin layer of SiO2 on a silicon single crystal have been used. Characterization of the different stages in the reaction procedure has been performed by a combination of conventional and angle-resolved X-ray photoelectron spectroscopy (XPS) using RuCl3/P(C6H5)2/SiO2/Si(100) model precursors. Different types of ruthenium centra have been identified.

Synthesis and Characterization of Monolayer Bimetallic Surfaces: A Synchrotron NEXAFS and XPS Study

2019 ◽  
Vol 19 (27) ◽  
pp. 97-106 ◽  
Author(s):  
Robert E. Rettew ◽  
James W. Guthrie ◽  
Cherno Jaye ◽  
Daniel Fischer ◽  
Faisal Alamgir
Keyword(s):  
Synthesis And Characterization ◽  
Bimetallic Surfaces ◽  
Xps Study

Preparation and characterization of SiO2/Au nanocomposites by R.F. Sputtering

1997 ◽  
Vol 501 ◽  
Author(s):  
Shinya Terauchi ◽  
Hiroyuki Umehara ◽  
Naoto Koshizaki ◽  
Takeshi Sasaki
Keyword(s):  
Chemical Shift ◽  
Au Nanoparticles ◽  
Xps Study

ABSTRACTWe fabricated SiO2/Au nanocomposites using alternate sputtering method. The size of the Au particles seem was unchanged by the SiO2 sputtering and well controllable by the sputtering parameters. The nanoparticles in SiO2 were observed by TEM and the nanocomposites were characterized using XPS technique. TEM observation revealed the size of Au nanoparticles to be 2–15 nm. We observed a chemical shift of the Au4f peak in the XPS study. We demonstrate the efficiency of the technique for controlling the size and quantity of nanoparticles dispersed in nanocomposites.

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