scholarly journals Interface-charged impurity scattering in semiconductor MOSFETs and MODFETs: temperature-dependent resistivity and 2D ‘metallic` behavior

2000 ◽  
Vol 27 (5-6) ◽  
pp. 421-424 ◽  
Author(s):  
S.Das Sarma ◽  
E.H Hwang ◽  
Igor Žutić
2010 ◽  
Vol 82 (4) ◽  
Author(s):  
Shudong Xiao ◽  
Jian-Hao Chen ◽  
Shaffique Adam ◽  
Ellen D. Williams ◽  
Michael S. Fuhrer

2009 ◽  
Vol 149 (27-28) ◽  
pp. 1072-1079 ◽  
Author(s):  
S. Adam ◽  
E.H. Hwang ◽  
E. Rossi ◽  
S. Das Sarma

Sign in / Sign up

Export Citation Format

Share Document