Interface-charged impurity scattering in semiconductor MOSFETs and MODFETs: temperature-dependent resistivity and 2D ‘metallic` behavior
2000 ◽
Vol 27
(5-6)
◽
pp. 421-424
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1990 ◽
Vol 160
(2)
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pp. K177-K181
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2011 ◽
Vol 302
◽
pp. 012015
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2009 ◽
Vol 149
(27-28)
◽
pp. 1072-1079
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1977 ◽
Vol 10
(10)
◽
pp. 1589-1593
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2020 ◽
Vol 121
◽
pp. 114149
1999 ◽
Vol 83
(1)
◽
pp. 164-167
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